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A Ru-Pt alloy electrode to suppress leakage currents of dynamic random-access memory capacitorsGo to Link

Pyeon, Jung Joon; Cho, Cheol Jin; Jeong, Doo Seok; Kim, Jin-Sang; Kang, Chong-Yun; Kim, Seong Keun

ArticleIssue Date2018CitationNANOTECHNOLOGY, v.29, no.45PublisherIOP PUBLISHING LTD
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