Renjie, Liao; Yuwen, Xiong; Ethan, Fetaya; Lisa, Zhang; Yoon, Ki jung; Xaq, Pitkow; Raquel, Urtasun; Richard, Zemel
ArticleIssue Date2018CitationInternational Conference on Machine Learning, v.80, pp.3082 - 3091PublisherProceedings of Machine Learning Research