Myoung, Seung Joo; Lee, Hyunkyu; Shin, Dong Hyeop; Seo, Youngjin; Kim, Wonjung; Cho, Jung Rae; Kim, Changwook; Bae, Jong-Ho; Choi, Sung-Jin; Kim, Dong Myong, et al.
ArticleIssue Date2025CitationIEEE Transactions on Electron Devices, v.72, no.5, pp 2374 - 2380PublisherInstitute of Electrical and Electronics Engineers