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FUN-AD: Fully Unsupervised Learning for Anomaly Detection with Noisy Training Data Go to Link

Im, Jiin; Son, Yongho; Hong, Je Hyeong

ArticleIssue Date2025CitationIEEE/CVF Winter Conference on Applications of Computer Vision (WACV), pp 9447 - 9456

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Long-tailed detection and classification of wafer defects from scanning electron microscope images robust to diverse image backgrounds and defect scales Go to Link

Park, Taekyeong; Son, Yongho; Moon, Sanghyuk; Han, Seungju; Hong, Je Hyeong

ArticleIssue Date2025CitationEngineering Applications of Artificial Intelligence, v.162, pp 1 - 17PublisherPergamon Press Ltd.

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PIDDNet: RGB-Depth Fusion Network for Real-time Semantic Segmentation Go to Link

Shin, Yunsik; Lee, Chaehyun; Son, Yongho; Kim, YangGon; Park, Junghee; Choi, Jun Won

ArticleIssue Date2023CitationInternational Conference on ICT Convergence, pp 1049 - 1052PublisherIEEE Computer Society

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Browsing by Son, YonghoAuthor

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