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Improving the Gate Stability of ZnO Thin-Film Transistors with Aluminum Oxide Dielectric LayersGo to Link

Oh, Min Suk; Lee, Kimoon; Song, Jong Han; Lee, Byoung H.; Sung, Myung Mo; Hwang, Do Kyung; Im, Seongil

ArticleIssue Date2008CitationJournal of the Electrochemical Society, v.155, no.12, pp H1009 - H1014PublisherElectrochemical Society, Inc.
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