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Adhesion of NCF to oxidized Si wafers after oxygen plasma treatmentGo to Link

Jang, Min-Seok; Ma, Sung Woo; Song, Jongsoo; Sung, Myungmo; Kim, Young-Ho

ArticleIssue Date2017CitationMicroelectronics and Reliability, v.78, pp 220 - 226PublisherElsevier Ltd.
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