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Patent indicators for macroeconomic growth-the value of patents estimated by export volumeGo to Link

Frietsch, Rainer; Neuhaeusler, Peter; Jung, Taehyun; Van Looy, Bart

ArticleIssue Date2014CitationTechnovation, v.34, no.9, pp 546 - 558PublisherPergamon Press Ltd.
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