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전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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SCIESCOPUS
Arc Detection and Severity Analysis for Plasma Etching ProcessesGo to Linkopen access

Ko, Doochan; Kim, Daniel Jin Hun; Wong, Richard; Joe, Inwhee

ArticleIssue Date2026CitationIEEE ACCESS, v.14, pp 30476 - 30490PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
Enhancing Maritime Data Integration for Platform Services with Sequence-to-Sequence Models and Statistical RefinementGo to Linkopen access

Hwang, Hyoseong; Wong, Richard; Lim, Ducsun; Kang, Jonggu; Joe, Inwhee

ArticleIssue Date2025CitationIEEE Access, v.13, pp 58636 - 58648PublisherInstitute of Electrical and Electronics Engineers Inc.
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