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Electrical Characterization of the Self-Heating Effect in Oxide Semiconductor Thin-Film Transistors Using Pulse-Based MeasurementsGo to Link

Manh-Cuong Nguyen; On, Nuri; Ji, Hyungmin; An Hoang-Thuy Nguyen; Choi, Sujin; Cheon, Jonggyu; Yu, Kyoung-Moon; Cho, Seong-Yong; Kim, JinHyun; Kim, Sangwoo, et al.

ArticleIssue Date2018CitationIEEE Transactions on Electron Devices, v.65, no.6, pp 2492 - 2497PublisherInstitute of Electrical and Electronics Engineers
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