Lee, Daehyeon; Shin, Ohsuk; Cha, Yeonghyeon; Lee, Junghee; Yun, Taisic; Kim, Jihye; Oh, Hyunok; Nicopoulos, Chrysostomos; Lee, Sang Su
ArticleIssue Date2024CitationIEEE Access, v.12, pp 114008 - 114022PublisherInstitute of Electrical and Electronics Engineers Inc.