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Positive impact of surface defects on Maxwell's displacement current-driven nano-LEDs: The application of TENG technologyGo to Link

Li, Wenhao; Zhang, Shuqian; Wang, Kun; Qiu, Jiawen; Li, Junlong; Zhu, Jiaye; Suk, Chan Hee; Wu, Chaoxing; Zhou, Xiongtu; Zhang, Yongai, et al.

ArticleIssue Date2024CitationNano Energy, v.129, no.B, pp 1 - 9PublisherElsevier BV
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