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Wafer classification using a convolutional neural network considering small and imbalanced wafer map data
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 이동희 | - |
| dc.date.accessioned | 2021-08-02T09:56:53Z | - |
| dc.date.available | 2021-08-02T09:56:53Z | - |
| dc.date.created | 2021-07-01 | - |
| dc.date.issued | 2019-12-05 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/11146 | - |
| dc.publisher | Asia Pacific Industrial Engineering & Management Society | - |
| dc.title | Wafer classification using a convolutional neural network considering small and imbalanced wafer map data | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | 이동희 | - |
| dc.identifier.bibliographicCitation | The 20th Asia Pacific Industrial Engineering And Management Systems | - |
| dc.relation.isPartOf | The 20th Asia Pacific Industrial Engineering And Management Systems | - |
| dc.citation.title | The 20th Asia Pacific Industrial Engineering And Management Systems | - |
| dc.citation.conferencePlace | 일본 가나자와 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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