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Photocurrents Recovery in GaN UV Sensors Using Microheaters at Low Temperatures

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dc.contributor.authorShin, Sanghun-
dc.contributor.authorLee, Heewon-
dc.contributor.authorSo, Hongyun-
dc.date.accessioned2021-07-30T04:45:14Z-
dc.date.available2021-07-30T04:45:14Z-
dc.date.created2021-07-14-
dc.date.issued2021-04-
dc.identifier.issn2169-3536-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/1295-
dc.description.abstractAt various low-temperature conditions, it is difficult to obtain an accurate sensing response due to temperature-dependent material properties such as bandgap and resistivity of semiconductors. In this study, a gallium nitride (GaN)-based ultraviolet (UV) photodetector with a microheater was demonstrated to compensate for the low-temperature effects. A parallel-type platinum microheater array was fabricated to supply thermal energy by Joule heating. In addition, a silicon oxide layer was deposited between the heater and the GaN surface, allowing an independent voltage supply. Therefore, the change in the signal level was successfully recovered to the initial state in the temperature range of −27.4−11.5°C within ~0.64% error without electrical interference. This study supports an active, accurate, and reliable method for the stable measurement of UV signals in various low-temperature environments such as freezer warehouses, Antarctic research stations, and in space.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titlePhotocurrents Recovery in GaN UV Sensors Using Microheaters at Low Temperatures-
dc.typeArticle-
dc.contributor.affiliatedAuthorSo, Hongyun-
dc.identifier.doi10.1109/ACCESS.2021.3070916-
dc.identifier.scopusid2-s2.0-85103882922-
dc.identifier.wosid000640996400001-
dc.identifier.bibliographicCitationIEEE ACCESS, v.9, pp.54184 - 54189-
dc.relation.isPartOfIEEE ACCESS-
dc.citation.titleIEEE ACCESS-
dc.citation.volume9-
dc.citation.startPage54184-
dc.citation.endPage54189-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaTelecommunications-
dc.relation.journalWebOfScienceCategoryComputer Science, Information Systems-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryTelecommunications-
dc.subject.keywordPlusGallium nitride-
dc.subject.keywordPlusHeating equipment-
dc.subject.keywordPlusIII-V semiconductors-
dc.subject.keywordPlusLow temperature effects-
dc.subject.keywordPlusMicroelectromechanical devices-
dc.subject.keywordPlusPhotocurrents-
dc.subject.keywordPlusSilicon compounds-
dc.subject.keywordPlusSilicon oxides-
dc.subject.keywordPlusWide band gap semiconductors-
dc.subject.keywordPlusElectrical interference-
dc.subject.keywordPlusGallium nitrides (GaN)-
dc.subject.keywordPlusLow temperature conditions-
dc.subject.keywordPlusLow temperature environment-
dc.subject.keywordPlusMicro-heater array-
dc.subject.keywordPlusSilicon oxide layers-
dc.subject.keywordPlusStable measurements-
dc.subject.keywordPlusTemperature-dependent material properties-
dc.subject.keywordPlusTemperature-
dc.subject.keywordAuthorTemperature measurement-
dc.subject.keywordAuthorTemperature sensors-
dc.subject.keywordAuthorHeating systems-
dc.subject.keywordAuthorSensors-
dc.subject.keywordAuthorPhotoconductivity-
dc.subject.keywordAuthorPhotodetectors-
dc.subject.keywordAuthorGallium nitride-
dc.subject.keywordAuthorGallium nitride-
dc.subject.keywordAuthorultraviolet sensors-
dc.subject.keywordAuthorphotocurrent-
dc.subject.keywordAuthormicroheater-
dc.subject.keywordAuthorlow temperature-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/9395076-
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