Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Defect study on amorphous InGaZnO thin-film transistors by drain current transients

Full metadata record
DC Field Value Language
dc.contributor.author김은규-
dc.date.accessioned2021-12-24T01:39:28Z-
dc.date.available2021-12-24T01:39:28Z-
dc.date.created2021-11-27-
dc.date.issued2021-08-20-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/133695-
dc.publisher한국진공학회-
dc.titleDefect study on amorphous InGaZnO thin-film transistors by drain current transients-
dc.typeConference-
dc.contributor.affiliatedAuthor김은규-
dc.identifier.bibliographicCitation제 61회 한국진공학회 하계정기학술대회-
dc.relation.isPartOf제 61회 한국진공학회 하계정기학술대회-
dc.citation.title제 61회 한국진공학회 하계정기학술대회-
dc.citation.conferencePlace소노캄 제주-
dc.type.rimsCONF-
dc.description.journalClass2-
Files in This Item
There are no files associated with this item.
Appears in
Collections
서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetrics

Total Views & Downloads

BROWSE