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Deep Learning Based Feature Extraction With Fusion Regularization On Sensor Signals of Semiconductor Manufacturing Process
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 이희정 | - |
| dc.date.accessioned | 2021-08-02T11:33:40Z | - |
| dc.date.available | 2021-08-02T11:33:40Z | - |
| dc.date.issued | 2019-10-20 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/13897 | - |
| dc.title | Deep Learning Based Feature Extraction With Fusion Regularization On Sensor Signals of Semiconductor Manufacturing Process | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 2019 INFORMS Annual Meeting | - |
| dc.citation.conferencePlace | Seattle | - |
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