Evolution of the surface morphology of chalcogenide glass under uniaxial pressure

Abstract

In an effort to establish conditions for the imprinting process of chalcogenide glasses, we have investigated the evolution of surface morphology of some Se-based chalcogenide glasses under uniaxial pressure applied at elevated temperatures. Vertical displacement of a quartz stamp as well as the resulting changes in the surface morphology of samples, monitored as functions of uniaxial pressure, temperature, and duration, showed that the samples were reshaped well to reflect the shape of a stamp up to a few hundred micrometers in depth. In addition to this overall deformation, mostly circular-shaped dimples with sizes up to several tens of micrometers in diameter appeared on the pressed surface of samples in some circumstances. The appearance of such dimpled surfaces turned out to be affected by tiny quartz particles detached from the stamp and/or fine scratches existing on the sample surface. However, the surface coverage and the number of those dimples could be controlled by adjusting the processing conditions. The empirical correlation between the characteristics of the dimpled surfaces and the processing conditions is discussed.