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Enhancing the dielectric property of 0.69PZT-0.31PZNN thick films by optimizing the poling condition

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dc.contributor.authorSong, Daniel-
dc.contributor.authorWoo, Min Sik-
dc.contributor.authorAhn, Jung Hwan-
dc.contributor.authorSung, Tae Hyun-
dc.date.accessioned2022-07-07T05:41:25Z-
dc.date.available2022-07-07T05:41:25Z-
dc.date.created2021-05-12-
dc.date.issued2015-05-
dc.identifier.issn0374-4884-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/143518-
dc.description.abstractWe investigated how the applied electric-field's magnitude and the poling time affected, respectively, the dielectric property and the microstructure of piezoelectric lead zirconate titanate/lead zirconate nickel niobate (PZT-PZNN) thick films in order to apply the films to piezoelectric energy harvesters. Several 300-A mu m-thick, 10 x 10-mm(2) PZT-PZNN squares were tape cast, laminated, sintered, and poled under 2-, 4-, 6-, 10-, 14-, and 15-kV/mm electric fields for 30 min. The 10-kV/mm electric field produced the highest d (33) x g (33) without mechanically damaging the sample. Further, samples were sintered at 950, 1000, and 1020 A degrees C and subsequently poled at 10 kV/mm (previously determined as the magnitude of the optimal poling electric field) for 15, 30, 60, 120, and 240 min to investigate how the poling time affected the piezoelectric ceramic's microstructure. The optimal poling time for all the sintered samples was 60 min. Further, the piezoelectric ceramics composed of small grains and poled longer than 60 min showed higher dielectric constants. However, those composed of large grains and poled for times shorter than 60 min showed higher dielectric constants because the element mobility of the piezoelectric ceramics increased with increasing poling time.-
dc.language영어-
dc.language.isoen-
dc.publisherKOREAN PHYSICAL SOC-
dc.titleEnhancing the dielectric property of 0.69PZT-0.31PZNN thick films by optimizing the poling condition-
dc.typeArticle-
dc.contributor.affiliatedAuthorSung, Tae Hyun-
dc.identifier.doi10.3938/jkps.66.1549-
dc.identifier.scopusid2-s2.0-84930681844-
dc.identifier.wosid000355747300018-
dc.identifier.bibliographicCitationJOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.66, no.10, pp.1549 - 1553-
dc.relation.isPartOfJOURNAL OF THE KOREAN PHYSICAL SOCIETY-
dc.citation.titleJOURNAL OF THE KOREAN PHYSICAL SOCIETY-
dc.citation.volume66-
dc.citation.number10-
dc.citation.startPage1549-
dc.citation.endPage1553-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.identifier.kciidART001992595-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Multidisciplinary-
dc.subject.keywordPlusPIEZOELECTRIC PROPERTIES-
dc.subject.keywordPlusPOLARIZATION-
dc.subject.keywordPlusSENSOR-
dc.subject.keywordAuthorPolarization-
dc.subject.keywordAuthorPZT-PZNN-
dc.subject.keywordAuthorThick film-
dc.subject.keywordAuthorEnergy harvesting-
dc.identifier.urlhttps://link.springer.com/article/10.3938/jkps.66.1549-
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