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Antiferromagnetic ordering of dangling-bond electrons at the stepped Si(001) surface
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Jun-Ho | - |
| dc.contributor.author | Kim, Sun-Woo | - |
| dc.contributor.author | Cho, Jun-Hyung | - |
| dc.date.accessioned | 2022-07-07T06:46:54Z | - |
| dc.date.available | 2022-07-07T06:46:54Z | - |
| dc.date.issued | 2013-03 | - |
| dc.identifier.issn | 0021-9606 | - |
| dc.identifier.issn | 1089-7690 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/143758 | - |
| dc.description.abstract | Using first-principles density-functional calculations, we explore the possibility of magnetic order at the rebonded D-B step of the Si(001) surface. The rebonded D-B step containing threefold coordinated Si atoms can be treated as a one-dimensional dangling-bond (DB) wire along the step edge. We find that Si atoms composing the step edge are displaced up and down alternatively due to Jahn-Teller-like distortion, but, if Si dimers on the terrace are passivated by H atoms, the antiferromagnetic (AFM) order can be stabilized at the step edge with a suppression of Jahn-Teller-like distortion. We also find that the energy preference of AFM order over Jahn-Teller-like distortion is enhanced in an oscillatory way as the length of DB wires decreases, showing the so-called quantum size effects. | - |
| dc.format.extent | 5 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | American Institute of Physics | - |
| dc.title | Antiferromagnetic ordering of dangling-bond electrons at the stepped Si(001) surface | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1063/1.4794162 | - |
| dc.identifier.scopusid | 2-s2.0-84875161706 | - |
| dc.identifier.wosid | 000316543400051 | - |
| dc.identifier.bibliographicCitation | The Journal of Chemical Physics, v.138, no.10, pp 1 - 5 | - |
| dc.citation.title | The Journal of Chemical Physics | - |
| dc.citation.volume | 138 | - |
| dc.citation.number | 10 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 5 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Chemistry | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
| dc.relation.journalWebOfScienceCategory | Physics, Atomic, Molecular & Chemical | - |
| dc.subject.keywordPlus | SCANNING TUNNELING MICROSCOPE | - |
| dc.subject.keywordPlus | GRAPHENE | - |
| dc.subject.keywordPlus | STATE | - |
| dc.subject.keywordPlus | LAYER | - |
| dc.subject.keywordPlus | EDGE | - |
| dc.identifier.url | https://aip.scitation.org/doi/10.1063/1.4794162 | - |
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