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Cited 7 time in webofscience Cited 9 time in scopus
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Propagation Model of High-Power Electromagnetic Pulse by Using a Serial-Parallel Resistors Circuit

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dc.contributor.authorLee, Kun-A-
dc.contributor.authorKo, Kwang-Cheol-
dc.date.accessioned2022-07-07T13:28:53Z-
dc.date.available2022-07-07T13:28:53Z-
dc.date.created2021-05-12-
dc.date.issued2014-10-
dc.identifier.issn0093-3813-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/144496-
dc.description.abstractThe risk of high power electromagnetic (HPEM) pulse is dramatically increasing as the output of HPEM pulse increases and the affected electronic devices becomes smaller [1], [2]. There are largely two ways of coupling HPEM pulse: 1) front door coupling, which is through antennas and sensors to receive signals and 2) back-door coupling, which is through an unintended way, such as punctures and slots. In this paper, we modeled the loss phenomenon of HPEM pulse which happens when HPEM pulse radiated from HPEM system propagates to the receiving antenna. The loss circuit consists of serial-parallel resistors, each value of resistor is formularized as distance. Our modeling consists of two parts: 1) one-stage model, which means initial value for various applications and 2) nth-stage model, which means additional distances. Therefore, we could figure out the effect of HPEM on antenna as the propagation distance changes. After the due simulations, we confirm our hypothesis as the HPEM pulse which reaches to receiving antenna is consistent with the existing theory. This circuit modeling is very remarkable in that it understands two different HPEM system and propagation/receiving antenna as one whole system.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titlePropagation Model of High-Power Electromagnetic Pulse by Using a Serial-Parallel Resistors Circuit-
dc.typeArticle-
dc.contributor.affiliatedAuthorKo, Kwang-Cheol-
dc.identifier.doi10.1109/TPS.2014.2342794-
dc.identifier.scopusid2-s2.0-84908448111-
dc.identifier.wosid000344546200064-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON PLASMA SCIENCE, v.42, no.10, pp.3309 - 3312-
dc.relation.isPartOfIEEE TRANSACTIONS ON PLASMA SCIENCE-
dc.citation.titleIEEE TRANSACTIONS ON PLASMA SCIENCE-
dc.citation.volume42-
dc.citation.number10-
dc.citation.startPage3309-
dc.citation.endPage3312-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Fluids & Plasmas-
dc.subject.keywordPlusSUSCEPTIBILITY-
dc.subject.keywordPlusMICROWAVES-
dc.subject.keywordPlusHPEM-
dc.subject.keywordAuthorAntenna theory-
dc.subject.keywordAuthorcircuit simulation-
dc.subject.keywordAuthorelectromagnetic propagation-
dc.subject.keywordAuthorpropagation losses-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/6876195-
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