Cited 2 time in
Self-assembled line growth of allyl alcohol on the H-terminated Si(100)-(2 x 1) surface
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Choi, Yun-Ki | - |
| dc.contributor.author | Choi, Jin-Ho | - |
| dc.contributor.author | Cho, Jun-Hyung | - |
| dc.date.accessioned | 2022-07-07T14:09:18Z | - |
| dc.date.available | 2022-07-07T14:09:18Z | - |
| dc.date.issued | 2012-02 | - |
| dc.identifier.issn | 0039-6028 | - |
| dc.identifier.issn | 1879-2758 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/144791 | - |
| dc.description.abstract | Using first-principles density-functional calculations, we investigate the growth mechanism of allyl alcohol (ALA) line on the H-terminated Si(100)-(2 x 1) surface. Unlike the ally! mercaptan (CH2=CH-CH2-SH) line, which was observed to grow across the Si dimer rows, we find that ALA (CH2=CH-CH2-OH) has the line growth along the Si dimer row. The self-assembled growth of ALA line occurs via the radical chain reaction mechanism, similar to the case of a typical alkene molecule, styrene. Our calculated energy profile along the reaction pathway shows that the different growth direction of ALA line compared with that of allyl mercaptan line is ascribed to the great instability of the oxygen radical intermediate, which prevents the line growth across the dimer rows. | - |
| dc.format.extent | 3 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Elsevier BV | - |
| dc.title | Self-assembled line growth of allyl alcohol on the H-terminated Si(100)-(2 x 1) surface | - |
| dc.type | Article | - |
| dc.publisher.location | 네델란드 | - |
| dc.identifier.doi | 10.1016/j.susc.2011.11.008 | - |
| dc.identifier.scopusid | 2-s2.0-84855472008 | - |
| dc.identifier.wosid | 000300458600054 | - |
| dc.identifier.bibliographicCitation | Surface Science, v.606, no.3-4, pp 461 - 463 | - |
| dc.citation.title | Surface Science | - |
| dc.citation.volume | 606 | - |
| dc.citation.number | 3-4 | - |
| dc.citation.startPage | 461 | - |
| dc.citation.endPage | 463 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Chemistry | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
| dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
| dc.subject.keywordPlus | SCANNING-TUNNELING-MICROSCOPY | - |
| dc.subject.keywordAuthor | Density functional calculations | - |
| dc.subject.keywordAuthor | Reaction pathway | - |
| dc.subject.keywordAuthor | Molecular line | - |
| dc.subject.keywordAuthor | Silicon surface | - |
| dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S0039602811004419?via%3Dihub | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1366
COPYRIGHT © 2024 HANYANG UNIVERSITY.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.
