Cited 8 time in
Fast Adaptation to Super-Resolution Networks via Meta-learning
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Seobin | - |
| dc.contributor.author | Yoo, Jinsu | - |
| dc.contributor.author | Cho, Donghyeon | - |
| dc.contributor.author | Kim, Jiwon | - |
| dc.contributor.author | Kim, Tae Hyun | - |
| dc.date.accessioned | 2022-07-07T17:34:25Z | - |
| dc.date.available | 2022-07-07T17:34:25Z | - |
| dc.date.issued | 2020-08 | - |
| dc.identifier.issn | 0302-9743 | - |
| dc.identifier.issn | 1611-3349 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/145341 | - |
| dc.description.abstract | Conventional supervised super-resolution (SR) approaches are trained with massive external SR datasets but fail to exploit desirable properties of the given test image. On the other hand, self-supervised SR approaches utilize the internal information within a test image but suffer from computational complexity in run-time. In this work, we observe the opportunity for further improvement of the performance of single-image super-resolution (SISR) without changing the architecture of conventional SR networks by practically exploiting additional information given from the input image. In the training stage, we train the network via meta-learning; thus, the network can quickly adapt to any input image at test time. Then, in the test stage, parameters of this meta-learned network are rapidly fine-tuned with only a few iterations by only using the given low-resolution image. The adaptation at the test time takes full advantage of patch-recurrence property observed in natural images. Our method effectively handles unknown SR kernels and can be applied to any existing model. We demonstrate that the proposed model-agnostic approach consistently improves the performance of conventional SR networks on various benchmark SR datasets. | - |
| dc.format.extent | 16 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Springer Verlag | - |
| dc.title | Fast Adaptation to Super-Resolution Networks via Meta-learning | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1007/978-3-030-58583-9_45 | - |
| dc.identifier.scopusid | 2-s2.0-85097374393 | - |
| dc.identifier.bibliographicCitation | Lecture Notes in Computer Science, v.12372 LNCS, pp 754 - 769 | - |
| dc.citation.title | Lecture Notes in Computer Science | - |
| dc.citation.volume | 12372 LNCS | - |
| dc.citation.startPage | 754 | - |
| dc.citation.endPage | 769 | - |
| dc.type.docType | Conference Paper | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.subject.keywordPlus | Benchmarking | - |
| dc.subject.keywordPlus | Computer vision | - |
| dc.subject.keywordPlus | Optical resolving power | - |
| dc.subject.keywordPlus | Testing | - |
| dc.subject.keywordPlus | Fast adaptations | - |
| dc.subject.keywordPlus | Input image | - |
| dc.subject.keywordPlus | Low resolution images | - |
| dc.subject.keywordPlus | Metalearning | - |
| dc.subject.keywordPlus | Natural images | - |
| dc.subject.keywordPlus | Single images | - |
| dc.subject.keywordPlus | Super resolution | - |
| dc.subject.keywordPlus | Test images | - |
| dc.subject.keywordPlus | Image enhancement | - |
| dc.subject.keywordAuthor | Deep learning | - |
| dc.subject.keywordAuthor | Meta-learning | - |
| dc.subject.keywordAuthor | Patch recurrence | - |
| dc.subject.keywordAuthor | Single-image super-resolution | - |
| dc.identifier.url | https://link.springer.com/chapter/10.1007/978-3-030-58583-9_45 | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1366
COPYRIGHT © 2024 HANYANG UNIVERSITY.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.
