Cited 0 time in
An analysis of factors affecting point cloud registration for bin picking
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Jongwook | - |
| dc.contributor.author | Kim, Hyungmin | - |
| dc.contributor.author | Park, Jong-Il | - |
| dc.date.accessioned | 2022-07-08T16:02:18Z | - |
| dc.date.available | 2022-07-08T16:02:18Z | - |
| dc.date.created | 2021-05-13 | - |
| dc.date.issued | 2020-01 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/146318 | - |
| dc.description.abstract | The robotic bin picking system is commonly used to automate processes in the manufacturing industry, by estimating the six degree-of-freedom (6-DoF) pose of an object. In particular, in vision-based systems, the pose of an object is estimated by registering a 3D point cloud acquired from a computer-aided design (CAD) model with a 2.5D point cloud acquired from a depth map. The registration process requires the correspondence points between 3D point cloud and 2.5D point cloud. Unfortunately, since the 3D point cloud and the 2.5D point cloud have different dimensions, performing registration is more challenging than with equivalent dimensions. In this paper, therefore, we analyze the process of 3D point cloud to 2.5D point cloud registration through the experiments to perform stable bin picking task. For the experiments, 2.5D point cloud is synthesized from 3D CAD model and uniformly adjusted for density and depth noise. By registering 3D point cloud to adjusted 2.5D point cloud, we quantitatively analyze how the adjusted density and depth noise affect the registration process. | - |
| dc.language | 영어 | - |
| dc.language.iso | en | - |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
| dc.title | An analysis of factors affecting point cloud registration for bin picking | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Park, Jong-Il | - |
| dc.identifier.doi | 10.1109/ICEIC49074.2020.9051361 | - |
| dc.identifier.scopusid | 2-s2.0-85083494274 | - |
| dc.identifier.bibliographicCitation | 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020, pp.1 - 4 | - |
| dc.relation.isPartOf | 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020 | - |
| dc.citation.title | 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 4 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Conference Paper | - |
| dc.description.journalClass | 1 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.subject.keywordPlus | Computer aided design | - |
| dc.subject.keywordPlus | Degrees of freedom (mechanics) | - |
| dc.subject.keywordPlus | Surface measurement | - |
| dc.subject.keywordPlus | Automate process | - |
| dc.subject.keywordPlus | Computer aided design models | - |
| dc.subject.keywordPlus | Manufacturing industries | - |
| dc.subject.keywordPlus | Point cloud registration | - |
| dc.subject.keywordPlus | Registration process | - |
| dc.subject.keywordPlus | Robotic bin picking | - |
| dc.subject.keywordPlus | Six-degree-of-freedom (6-DoF) | - |
| dc.subject.keywordPlus | Vision based system | - |
| dc.subject.keywordPlus | 3D modeling | - |
| dc.subject.keywordAuthor | 3D point cloud to 2.5D point cloud | - |
| dc.subject.keywordAuthor | Point cloud registration | - |
| dc.subject.keywordAuthor | Robotic bin picking | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/9051361 | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1366
COPYRIGHT © 2024 HANYANG UNIVERSITY.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.
