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Structural decomposition of technological domain using patent co-classification and classification hierarchy

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dc.contributor.authorMun, Changbae-
dc.contributor.authorYoon, Sejun-
dc.contributor.authorPark, Hyunseok-
dc.date.accessioned2022-07-09T00:40:02Z-
dc.date.available2022-07-09T00:40:02Z-
dc.date.created2021-05-12-
dc.date.issued2019-11-
dc.identifier.issn0138-9130-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/146827-
dc.description.abstractThis paper proposes a new method for decomposing a technological domain (TD). Specifically, the method identifies sub-TDs at the different levels of technological hierarchy within the TD based on the characteristics of patent co-classification and classification hierarchy. We defined the smallest class, named Minimum Overlapped Class (MOC), constructed by overlaps of sub-group IPC(s) and sub-class UPC(s), and sub-TD is basically identified as a set of the MOCs. In order to cluster the MOCs, technological distances among MOCs are calculated based on patent co-classification and hierarchical structure of patent classification systems. Technologically similar MOCs are grouped by using a hierarchical clustering and the identified clusters at the different level of hierarchy show the hierarchical structure of a TD. Detailed technological content for each sub-TD is represented by extracting representative keywords through a text-mining technique. The method is empirically tested by the solar photovoltaic technology and the results show that the identified sub-TDs are reasonably acceptable by qualitative analysis.-
dc.language영어-
dc.language.isoen-
dc.publisherSPRINGER-
dc.titleStructural decomposition of technological domain using patent co-classification and classification hierarchy-
dc.typeArticle-
dc.contributor.affiliatedAuthorPark, Hyunseok-
dc.identifier.doi10.1007/s11192-019-03223-8-
dc.identifier.scopusid2-s2.0-85073624659-
dc.identifier.wosid000491201000003-
dc.identifier.bibliographicCitationSCIENTOMETRICS, v.121, no.2, pp.633 - 652-
dc.relation.isPartOfSCIENTOMETRICS-
dc.citation.titleSCIENTOMETRICS-
dc.citation.volume121-
dc.citation.number2-
dc.citation.startPage633-
dc.citation.endPage652-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassssci-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaInformation Science & Library Science-
dc.relation.journalWebOfScienceCategoryComputer Science-
dc.relation.journalWebOfScienceCategoryInterdisciplinary Applications-
dc.relation.journalWebOfScienceCategoryInformation Science & Library Science-
dc.subject.keywordPlusNOVELTY-
dc.subject.keywordPlusSEARCH-
dc.subject.keywordPlusTRAJECTORIES-
dc.subject.keywordPlusMETHODOLOGY-
dc.subject.keywordPlusKEYWORD-
dc.subject.keywordPlusTRENDS-
dc.subject.keywordAuthorClassification overlap method (COM)-
dc.subject.keywordAuthorPatent co-classification-
dc.subject.keywordAuthorClassification hierarchy-
dc.subject.keywordAuthorSub-technologies-
dc.subject.keywordAuthorSub-domain-
dc.subject.keywordAuthorHierarchical class similarity-
dc.identifier.urlhttps://link.springer.com/article/10.1007/s11192-019-03223-8-
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