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High voltage calibration method for the CMS RPC detector

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dc.contributor.authorReyes-Almanza, R.-
dc.contributor.authorDimitrov, A.-
dc.contributor.authorFagot, A.-
dc.contributor.authorGul, M.-
dc.contributor.authorRoskas, C.-
dc.contributor.authorTytgat, M.-
dc.contributor.authorZaganidis, N.-
dc.contributor.authorFonseca De Souza, S.-
dc.contributor.authorSantoro, A.-
dc.contributor.authorDa Silva De Araujo, F. Torres-
dc.contributor.authorAleksandrov, A.-
dc.contributor.authorHadjiiska, R.-
dc.contributor.authorIaydjiev, P.-
dc.contributor.authorRodozov, M.-
dc.contributor.authorShopova, M.-
dc.contributor.authorSultanov, G.-
dc.contributor.authorLitov, L.-
dc.contributor.authorPavlov, B.-
dc.contributor.authorPetkov, P.-
dc.contributor.authorPetrov, A.-
dc.contributor.authorQian, S. J.-
dc.contributor.authorHan, D.-
dc.contributor.authorYi, W.-
dc.contributor.authorAvila, C.-
dc.contributor.authorCabrera, A.-
dc.contributor.authorCarrillo, C.-
dc.contributor.authorSegura, M.-
dc.contributor.authorAly, S.-
dc.contributor.authorAssran, Y.-
dc.contributor.authorMahrous, A.-
dc.contributor.authorMohamed, A.-
dc.contributor.authorCombaret, C.-
dc.contributor.authorGouzevitch, M.-
dc.contributor.authorGrenier, G.-
dc.contributor.authorLagarde, F.-
dc.contributor.authorLaktineh, I. B.-
dc.contributor.authorMathez, H.-
dc.contributor.authorMirabito, L.-
dc.contributor.authorShchablo, K.-
dc.contributor.authorBagaturia, I.-
dc.contributor.authorLomidze, D.-
dc.contributor.authorLomidze, I.-
dc.contributor.authorPant, L. M.-
dc.contributor.authorBhatnagar, V.-
dc.contributor.authorGupta, R.-
dc.contributor.authorKumari, R.-
dc.contributor.authorLohan, M.-
dc.contributor.authorSingh, J. B.-
dc.contributor.authorAmoozegar, V.-
dc.contributor.authorBoghrati, B.-
dc.contributor.authorGhasemy, H.-
dc.contributor.authorMalmir, S.-
dc.contributor.authorNajafabadi, M. Mohammadi-
dc.contributor.authorAbbrescia, M.-
dc.contributor.authorGelmi, A.-
dc.contributor.authorIaselli, G.-
dc.contributor.authorLezki, S.-
dc.contributor.authorPugliese, G.-
dc.contributor.authorBenussi, L.-
dc.contributor.authorBianco, S.-
dc.contributor.authorPiccolo, D.-
dc.contributor.authorPrimavera, F.-
dc.contributor.authorBuontempo, S.-
dc.contributor.authorCrescenzo, A.-
dc.contributor.authorGalati, G.-
dc.contributor.authorFienga, F.-
dc.contributor.authorOrso, I.-
dc.contributor.authorLista, L.-
dc.contributor.authorMeola, S.-
dc.contributor.authorPaolucci, P.-
dc.contributor.authorVoevodina, E.-
dc.contributor.authorBraghieri, A.-
dc.contributor.authorMontagna, P.-
dc.contributor.authorRessegotti, M.-
dc.contributor.authorRiccardi, C.-
dc.contributor.authorSalvini, P.-
dc.contributor.authorVitulo, P.-
dc.contributor.authorCho, S. W.-
dc.contributor.authorChoi, S. Y.-
dc.contributor.authorHong, B.-
dc.contributor.authorLee, K. S.-
dc.contributor.authorLim, J. H.-
dc.contributor.authorPark, S. K.-
dc.contributor.authorGoh, J.-
dc.contributor.authorKim, T. J.-
dc.contributor.authorCarrillo Moreno, S.-
dc.contributor.authorMiguel Colin, O.-
dc.contributor.authorVazquez Valencia, F.-
dc.contributor.authorCarpinteyro Bernardino, S.-
dc.contributor.authorEysermans, J.-
dc.contributor.authorPedraza, I.-
dc.contributor.authorUribe Estrada, C.-
dc.contributor.authorDuran-Osuna, M. C.-
dc.contributor.authorRamirez-Garcia, M.-
dc.contributor.authorRamirez-Sanchez, G.-
dc.contributor.authorSanchez-Hernandez, A.-
dc.contributor.authorRabadan-Trejo, R. I.-
dc.contributor.authorCastilla-Valdez, H.-
dc.contributor.authorRadi, A.-
dc.contributor.authorHoorani, H.-
dc.contributor.authorMuhammad, S.-
dc.contributor.authorShah, M. A.-
dc.contributor.authorCrotty, I.-
dc.date.accessioned2022-07-09T09:27:33Z-
dc.date.available2022-07-09T09:27:33Z-
dc.date.created2021-05-11-
dc.date.issued2019-09-
dc.identifier.issn1748-0221-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/147258-
dc.description.abstractThe Resistive Plate Chambers (RPC) are used for muon triggers in the CMS experiment. To calibrate the high voltage working-points (WP) and identify degraded detectors due to radiation or chemical damage, a high voltage scan has been performed using 2017 data from pp collisions at a center-of-mass energy of 13 TeV. In this paper, we present the calibration method and the latest results obtained for the 2017 data. A comparison with all scans taken since 2011 is considered to investigate the stability of the detector performance in time.-
dc.language영어-
dc.language.isoen-
dc.publisherIOP PUBLISHING LTD-
dc.titleHigh voltage calibration method for the CMS RPC detector-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, T. J.-
dc.identifier.doi10.1088/1748-0221/14/09/C09046-
dc.identifier.scopusid2-s2.0-85074437874-
dc.identifier.wosid000519117900009-
dc.identifier.bibliographicCitationJOURNAL OF INSTRUMENTATION, v.14, no.9, pp.1 - 8-
dc.relation.isPartOfJOURNAL OF INSTRUMENTATION-
dc.citation.titleJOURNAL OF INSTRUMENTATION-
dc.citation.volume14-
dc.citation.number9-
dc.citation.startPage1-
dc.citation.endPage8-
dc.type.rimsART-
dc.type.docTypeArticle; Proceedings Paper-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaInstruments & Instrumentation-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.subject.keywordPlusAstrophysics-
dc.subject.keywordPlusCalibration-
dc.subject.keywordPlusCharged particles-
dc.subject.keywordPlusHigh energy lasers-
dc.subject.keywordPlusA-center-
dc.subject.keywordPlusCalibration method-
dc.subject.keywordPlusChemical damages-
dc.subject.keywordPlusDetector performance-
dc.subject.keywordPlusHigh energy physics detector-
dc.subject.keywordPlusHigh voltage-
dc.subject.keywordPlusMuon trigger-
dc.subject.keywordPlusResistive plate chambers-
dc.subject.keywordPlusParticle spectrometers-
dc.subject.keywordAuthorDetector alignment and calibration methods (lasers, sources, particle-beams)-
dc.subject.keywordAuthorPerformance of High Energy Physics Detectors-
dc.subject.keywordAuthorResistive-plate chambers-
dc.identifier.urlhttps://iopscience.iop.org/article/10.1088/1748-0221/14/09/C09046-
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