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A Novel and Facile Route to Synthesize Atomic‐Layered MoS2 Film for Large‐Area Electronics

Authors
Boandoh, StephenChoi, Soo HoPark, Ji-HoonPark, So YoungBang, SeunghoJeong, Mun SeokLee, Joo SongKim, Hyeong JinYang, WoochulChoi, Jae-YoungKim, Soo MinKim, Ki Kang
Issue Date
Aug-2017
Publisher
WILEY-V C H VERLAG GMBH
Keywords
chemical vapor deposition; growth mechanism; MoS2; photoluminescence; precursors
Citation
SMALL, v.13, no.39, pp.1 - 9
Indexed
SCIE
SCOPUS
Journal Title
SMALL
Volume
13
Number
39
Start Page
1
End Page
9
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/151797
DOI
10.1002/smll.201701306
ISSN
1613-6810
Abstract
High-quality and large-area molybdenum disulfide (MoS2) thin film is highly desirable for applications in large-area electronics. However, there remains a challenge in attaining MoS2 film of reasonable crystallinity due to the absence of appropriate choice and control of precursors, as well as choice of suitable growth substrates. Herein, a novel and facile route is reported for synthesizing few-layered MoS2 film with new precursors via chemical vapor deposition. Prior to growth, an aqueous solution of sodium molybdate as the molybdenum precursor is spun onto the growth substrate and dimethyl disulfide as the liquid sulfur precursor is supplied with a bubbling system during growth. To supplement the limiting effect of Mo (sodium molybdate), a supplementary Mo is supplied by dissolving molybdenum hexacarbonyl (Mo(CO)(6)) in the liquid sulfur precursor delivered by the bubbler. By precisely controlling the amounts of precursors and hydrogen flow, full coverage of MoS2 film is readily achievable in 20 min. Large-area MoS2 field effect transistors (FETs) fabricated with a conventional photolithography have a carrier mobility as high as 18.9 cm(2) V-1 s(-1), which is the highest reported for bottom-gated MoS2-FETs fabricated via photolithography with an on/off ratio of approximate to 10(5) at room temperature.
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