Nanoscale characterization of local structures and defects in photonic crystals using synchrotron-based transmission soft X-ray microscopy
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Nho, Hyun Woo | - |
dc.contributor.author | Kalegowda, Yogesh | - |
dc.contributor.author | Shin, Hyun-Joon | - |
dc.contributor.author | Yoon, Tae Hyun | - |
dc.date.accessioned | 2022-07-15T17:58:14Z | - |
dc.date.available | 2022-07-15T17:58:14Z | - |
dc.date.created | 2021-05-12 | - |
dc.date.issued | 2016-04 | - |
dc.identifier.issn | 2045-2322 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/154878 | - |
dc.description.abstract | For the structural characterization of the polystyrene (PS)-based photonic crystals (PCs), fast and direct imaging capabilities of full field transmission X-ray microscopy (TXM) were demonstrated at soft X-ray energy. PS-based PCs were prepared on an O-2-plasma treated Si3N4 window and their local structures and defects were investigated using this label-free TXM technique with an image acquisition speed of similar to 10 sec/frame and marginal radiation damage. Micro-domains of face-centered cubic (FCC (111)) and hexagonal close-packed (HCP (0001)) structures were dominantly found in PS-based PCs, while point and line defects, FCC (100), and 12-fold symmetry structures were also identified as minor components. Additionally, in situ observation capability for hydrated samples and 3D tomographic reconstruction of TXM images were also demonstrated. This soft X-ray full field TXM technique with faster image acquisition speed, in situ observation, and 3D tomography capability can be complementally used with the other X-ray microscopic techniques (i.e., scanning transmission X-ray microscopy, STXM) as well as conventional characterization methods (e.g., electron microscopic and optical/fluorescence microscopic techniques) for clearer structure identification of self-assembled PCs and better understanding of the relationship between their structures and resultant optical properties. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | NATURE RESEARCH | - |
dc.title | Nanoscale characterization of local structures and defects in photonic crystals using synchrotron-based transmission soft X-ray microscopy | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Yoon, Tae Hyun | - |
dc.identifier.doi | 10.1038/srep24488 | - |
dc.identifier.scopusid | 2-s2.0-84964262057 | - |
dc.identifier.wosid | 000374249800001 | - |
dc.identifier.bibliographicCitation | SCIENTIFIC REPORTS, v.6, pp.1 - 9 | - |
dc.relation.isPartOf | SCIENTIFIC REPORTS | - |
dc.citation.title | SCIENTIFIC REPORTS | - |
dc.citation.volume | 6 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 9 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | Y | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalWebOfScienceCategory | Multidisciplinary Sciences | - |
dc.subject.keywordPlus | COLLOIDAL CRYSTALS | - |
dc.subject.keywordPlus | THICKNESS | - |
dc.subject.keywordPlus | FIBERS | - |
dc.identifier.url | https://www.nature.com/articles/srep24488 | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1365
COPYRIGHT © 2021 HANYANG UNIVERSITY.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.