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Investigation of Geant4 Simulation of Electron Backscattering
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Basaglia, Tullio | - |
| dc.contributor.author | Han, Min Cheol | - |
| dc.contributor.author | Hoff, Gabriela | - |
| dc.contributor.author | Kim, Chan Hyeong | - |
| dc.contributor.author | Kim, Sung Hun | - |
| dc.contributor.author | Pia, Maria Grazia | - |
| dc.contributor.author | Saracco, Paolo | - |
| dc.date.accessioned | 2022-07-15T21:45:41Z | - |
| dc.date.available | 2022-07-15T21:45:41Z | - |
| dc.date.issued | 2015-08 | - |
| dc.identifier.issn | 0018-9499 | - |
| dc.identifier.issn | 1558-1578 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/156668 | - |
| dc.description.abstract | A test of Geant4 simulation of electron backscattering recently published in this journal prompted further investigation into the causes of the observed behaviour. An interplay between features of geometry and physics algorithms implemented in Geant4 is found to significantly affect the accuracy of backscattering simulation in some physics configurations. | - |
| dc.format.extent | 8 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Institute of Electrical and Electronics Engineers | - |
| dc.title | Investigation of Geant4 Simulation of Electron Backscattering | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1109/TNS.2015.2442292 | - |
| dc.identifier.scopusid | 2-s2.0-85027935353 | - |
| dc.identifier.wosid | 000360016400015 | - |
| dc.identifier.bibliographicCitation | IEEE Transactions on Nuclear Science, v.62, no.4, pp 1805 - 1812 | - |
| dc.citation.title | IEEE Transactions on Nuclear Science | - |
| dc.citation.volume | 62 | - |
| dc.citation.number | 4 | - |
| dc.citation.startPage | 1805 | - |
| dc.citation.endPage | 1812 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalResearchArea | Nuclear Science & Technology | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.relation.journalWebOfScienceCategory | Nuclear Science & Technology | - |
| dc.subject.keywordPlus | MULTIPLE-SCATTERING | - |
| dc.subject.keywordAuthor | Electrons | - |
| dc.subject.keywordAuthor | Geant4 | - |
| dc.subject.keywordAuthor | Monte Carlo | - |
| dc.subject.keywordAuthor | simulation | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/7161405 | - |
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