Elucidating the Crucial Role of Hole Injection Layer in Degradation of Organic Light-Emitting Diodes
DC Field | Value | Language |
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dc.contributor.author | Han, Tae Hee | - |
dc.contributor.author | Song, Wonjun | - |
dc.contributor.author | Lee, Tae-Woo | - |
dc.date.accessioned | 2022-07-16T00:17:44Z | - |
dc.date.available | 2022-07-16T00:17:44Z | - |
dc.date.created | 2021-05-13 | - |
dc.date.issued | 2015-02 | - |
dc.identifier.issn | 1944-8244 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/157895 | - |
dc.description.abstract | Although the luminous efficiency has been significantly improved in multilayered organic light-emitting diodes (OLEDs), understanding the major factors that influence degradation of OLEDs remains a major challenge due to their complex device structure. In this regard, we elucidate the crucial role of hole injection layer (HIL) in degradation of OLEDs by using systematically controlled hole injection interfaces. To analyze charge injection dependent degradation mechanism of OLEDs, we fabricate multilayered small-molecule OLEDs with molecularly controlled HILs. Although a reduced hole injection energy barrier greatly improves both a luminous efficiency and an operational lifetime (>10 times) of the OLEDs at the same time, large hole injection energy barrier increasingly aggravates its charge injection and transport during device operation. By using various kinds of nondestructive analyses at gradual stages of degradation, we demonstrate that accumulated charges at interfaces due to inefficient charge injection accelerates rate of device degradation. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | AMER CHEMICAL SOC | - |
dc.title | Elucidating the Crucial Role of Hole Injection Layer in Degradation of Organic Light-Emitting Diodes | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Han, Tae Hee | - |
dc.identifier.doi | 10.1021/am5072628 | - |
dc.identifier.scopusid | 2-s2.0-84922771799 | - |
dc.identifier.wosid | 000349580800016 | - |
dc.identifier.bibliographicCitation | ACS APPLIED MATERIALS & INTERFACES, v.7, no.5, pp.3117 - 3125 | - |
dc.relation.isPartOf | ACS APPLIED MATERIALS & INTERFACES | - |
dc.citation.title | ACS APPLIED MATERIALS & INTERFACES | - |
dc.citation.volume | 7 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 3117 | - |
dc.citation.endPage | 3125 | - |
dc.type.rims | ART | - |
dc.type.docType | 정기학술지(Article(Perspective Article포함)) | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.subject.keywordPlus | SMALL-MOLECULE | - |
dc.subject.keywordPlus | DEVICES | - |
dc.subject.keywordPlus | RELIABILITY | - |
dc.subject.keywordPlus | PERFORMANCE | - |
dc.subject.keywordPlus | EFFICIENCY | - |
dc.subject.keywordPlus | MECHANISM | - |
dc.subject.keywordPlus | FILM | - |
dc.subject.keywordAuthor | organic light-emitting diodes | - |
dc.subject.keywordAuthor | degradation | - |
dc.subject.keywordAuthor | device stability | - |
dc.subject.keywordAuthor | hole injection interface | - |
dc.identifier.url | https://pubs.acs.org/doi/10.1021/am5072628 | - |
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