An External Circuit Model for 3-D Electromagnetic Particle-In-Cell Simulations
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lin, Ming-Chieh | - |
dc.contributor.author | Zhou, Chuandong | - |
dc.contributor.author | Smithe, David N. | - |
dc.date.accessioned | 2022-07-16T04:10:33Z | - |
dc.date.available | 2022-07-16T04:10:33Z | - |
dc.date.created | 2021-05-13 | - |
dc.date.issued | 2014-06 | - |
dc.identifier.issn | 0018-9383 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/159685 | - |
dc.description.abstract | In this paper, for the first time, second-order accurate algorithms for coupling external circuit elements to 3-D electromagnetic (EM) particle-in-cell (PIC) simulations are developed and introduced. The circuit equation including an external voltage or current source, resistance, inductance, capacitance, and a dynamic EM and/or plasma load is solved simultaneously and self-consistently with the EM PIC updaters through an instant measured voltage V across the system to obtain the supplied current I for feeding into the system. This external circuit model has been demonstrated and implemented in a 3-D conformal finite-difference time-domain PIC code, Vorpal. The integrated simulation model can be widely used in the vacuum electronics community as well as in the plasma processing community if one wants to consider the effects of a power supply on operation of microwave tubes or plasma reaction chambers. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | An External Circuit Model for 3-D Electromagnetic Particle-In-Cell Simulations | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Lin, Ming-Chieh | - |
dc.identifier.doi | 10.1109/TED.2014.2304715 | - |
dc.identifier.scopusid | 2-s2.0-84901398198 | - |
dc.identifier.wosid | 000338026200018 | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON ELECTRON DEVICES, v.61, no.6, pp.1742 - 1748 | - |
dc.relation.isPartOf | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
dc.citation.title | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
dc.citation.volume | 61 | - |
dc.citation.number | 6 | - |
dc.citation.startPage | 1742 | - |
dc.citation.endPage | 1748 | - |
dc.type.rims | ART | - |
dc.type.docType | 정기학술지(Article(Perspective Article포함)) | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | PLASMA SIMULATION | - |
dc.subject.keywordPlus | FDTD ALGORITHM | - |
dc.subject.keywordPlus | CURRENTS | - |
dc.subject.keywordAuthor | Conformal finite-difference time-domain (CFDTD) | - |
dc.subject.keywordAuthor | electromagnetic (EM) | - |
dc.subject.keywordAuthor | external circuit | - |
dc.subject.keywordAuthor | particle-in-cell (PIC) | - |
dc.identifier.url | https://ieeexplore.ieee.org/document/6744605 | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1365
COPYRIGHT © 2021 HANYANG UNIVERSITY.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.