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Electron dosimetry in human skin: A reliability assessment of simulation scenarios
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Basaglia, Tullio | - |
| dc.contributor.author | Han, Haegin | - |
| dc.contributor.author | Han, Min Cheol | - |
| dc.contributor.author | Kim, Chan Hyeong | - |
| dc.contributor.author | Pia, Maria Grazia | - |
| dc.date.accessioned | 2021-08-02T12:53:22Z | - |
| dc.date.available | 2021-08-02T12:53:22Z | - |
| dc.date.created | 2021-05-11 | - |
| dc.date.issued | 2018-11 | - |
| dc.identifier.issn | 0000-0000 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/15980 | - |
| dc.description.abstract | The feasibility and reliability of Geant4-based simulation of human skin irradiation by low energy electrons (up to a few MeV) are reviewed, with emphasis on physics validation and the generation of a dedicated phantom for the simulation of Total Skin Electron Therapy. | - |
| dc.language | 영어 | - |
| dc.language.iso | en | - |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
| dc.title | Electron dosimetry in human skin: A reliability assessment of simulation scenarios | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Kim, Chan Hyeong | - |
| dc.identifier.doi | 10.1109/NSSMIC.2018.8824344 | - |
| dc.identifier.scopusid | 2-s2.0-85073097706 | - |
| dc.identifier.bibliographicCitation | 2018 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2018 - Proceedings, pp.1 - 2 | - |
| dc.relation.isPartOf | 2018 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2018 - Proceedings | - |
| dc.citation.title | 2018 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2018 - Proceedings | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 2 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Conference Paper | - |
| dc.description.journalClass | 1 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.subject.keywordPlus | Electrons | - |
| dc.subject.keywordPlus | Intelligent systems | - |
| dc.subject.keywordPlus | Medical imaging | - |
| dc.subject.keywordPlus | Phantoms | - |
| dc.subject.keywordPlus | Human phantoms | - |
| dc.subject.keywordPlus | Human skin | - |
| dc.subject.keywordPlus | Low energy electrons | - |
| dc.subject.keywordPlus | Reliability assessments | - |
| dc.subject.keywordPlus | validation | - |
| dc.subject.keywordPlus | Monte Carlo methods | - |
| dc.subject.keywordAuthor | computational human phantom | - |
| dc.subject.keywordAuthor | electron | - |
| dc.subject.keywordAuthor | Monte Carlo simulation | - |
| dc.subject.keywordAuthor | validation | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/8824344/ | - |
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- Kim, Chan Hyeong
- COLLEGE OF ENGINEERING (DEPARTMENT OF NUCLEAR ENGINEERING)