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Local stress distribution in GaN vertical light-emitting diodes fabricated using CLO and LLO methods (vol 46, 155104, 2013)
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Jinsub | - |
| dc.contributor.author | Goto, Takenari | - |
| dc.contributor.author | Yao, Takafumi | - |
| dc.contributor.author | Lee, Seogwoo | - |
| dc.contributor.author | Cho, Moungwhan | - |
| dc.date.accessioned | 2022-07-16T10:16:41Z | - |
| dc.date.available | 2022-07-16T10:16:41Z | - |
| dc.date.issued | 2013-05 | - |
| dc.identifier.issn | 0022-3727 | - |
| dc.identifier.issn | 1361-6463 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/162936 | - |
| dc.format.extent | 1 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | IOP Publishing Ltd. | - |
| dc.title | Local stress distribution in GaN vertical light-emitting diodes fabricated using CLO and LLO methods (vol 46, 155104, 2013) | - |
| dc.type | Article | - |
| dc.publisher.location | 영국 | - |
| dc.identifier.doi | 10.1088/0022-3727/46/19/199501 | - |
| dc.identifier.scopusid | 2-s2.0-84876907426 | - |
| dc.identifier.wosid | 000318146900017 | - |
| dc.identifier.bibliographicCitation | Journal of Physics D: Applied Physics, v.46, no.19, pp 1 - 1 | - |
| dc.citation.title | Journal of Physics D: Applied Physics | - |
| dc.citation.volume | 46 | - |
| dc.citation.number | 19 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 1 | - |
| dc.type.docType | Correction | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.identifier.url | https://iopscience.iop.org/article/10.1088/0022-3727/46/19/199501 | - |
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Related Researcher
- Park, Jinsub
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)