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Local stress distribution in GaN vertical light-emitting diodes fabricated using CLO and LLO methods (vol 46, 155104, 2013)

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dc.contributor.authorPark, Jinsub-
dc.contributor.authorGoto, Takenari-
dc.contributor.authorYao, Takafumi-
dc.contributor.authorLee, Seogwoo-
dc.contributor.authorCho, Moungwhan-
dc.date.accessioned2022-07-16T10:16:41Z-
dc.date.available2022-07-16T10:16:41Z-
dc.date.created2021-05-11-
dc.date.issued2013-05-
dc.identifier.issn0022-3727-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/162936-
dc.language영어-
dc.language.isoen-
dc.publisherIOP PUBLISHING LTD-
dc.titleLocal stress distribution in GaN vertical light-emitting diodes fabricated using CLO and LLO methods (vol 46, 155104, 2013)-
dc.typeArticle-
dc.contributor.affiliatedAuthorPark, Jinsub-
dc.identifier.doi10.1088/0022-3727/46/19/199501-
dc.identifier.scopusid2-s2.0-84876907426-
dc.identifier.wosid000318146900017-
dc.identifier.bibliographicCitationJOURNAL OF PHYSICS D-APPLIED PHYSICS, v.46, no.19, pp.1 - 1-
dc.relation.isPartOfJOURNAL OF PHYSICS D-APPLIED PHYSICS-
dc.citation.titleJOURNAL OF PHYSICS D-APPLIED PHYSICS-
dc.citation.volume46-
dc.citation.number19-
dc.citation.startPage1-
dc.citation.endPage1-
dc.type.rimsART-
dc.type.docTypeCorrection-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.identifier.urlhttps://iopscience.iop.org/article/10.1088/0022-3727/46/19/199501-
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