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Nonvolatile Hybrid Memory Cell Embedded with Ni Nanocrystals in Poly(3-hexylthiophene)
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Jong-Dae | - |
| dc.contributor.author | Park, Jea-Gun | - |
| dc.date.accessioned | 2022-07-16T12:29:03Z | - |
| dc.date.available | 2022-07-16T12:29:03Z | - |
| dc.date.issued | 2012-12 | - |
| dc.identifier.issn | 0021-4922 | - |
| dc.identifier.issn | 1347-4065 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/164038 | - |
| dc.description.abstract | We developed a cross-bar nonvolatile hybrid memory cell embedded with Ni nanocrystals in poly(3-hexylthiophene) (P3HT) with cell area of 4F(2), where F is a feature size. The cell demonstrated nonvolatile memory characteristics, such as a memory margin (I-on/I-off ratio) of similar to 5 x 10, over 103 endurance cycles of program-and-erase, and a retention time of 10(4) s at 85 degrees C. In addition, the mechanism of nonvolatile memory operation for the hybrid memory cell was confirmed by the combination of space-charge-limited current and a Fowler-Nordheim tunneling conduction. | - |
| dc.format.extent | 3 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | IOP Publishing Ltd | - |
| dc.title | Nonvolatile Hybrid Memory Cell Embedded with Ni Nanocrystals in Poly(3-hexylthiophene) | - |
| dc.type | Article | - |
| dc.publisher.location | 영국 | - |
| dc.identifier.doi | 10.1143/JJAP.51.120202 | - |
| dc.identifier.scopusid | 2-s2.0-84872516369 | - |
| dc.identifier.wosid | 000312003100002 | - |
| dc.identifier.bibliographicCitation | Japanese Journal of Applied Physics, v.51, no.12, pp 1 - 3 | - |
| dc.citation.title | Japanese Journal of Applied Physics | - |
| dc.citation.volume | 51 | - |
| dc.citation.number | 12 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 3 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | ELECTRICAL BISTABILITY | - |
| dc.subject.keywordPlus | SYSTEM | - |
| dc.identifier.url | https://iopscience.iop.org/article/10.1143/JJAP.51.120202 | - |
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