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Bidirectional Two-Terminal Switching Device Using Schottky Barrier for Spin-Transfer-Torque Magnetic Random Access Memory
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Yong-Sik | - |
| dc.contributor.author | Kil, Gyu-Hyun | - |
| dc.contributor.author | Song, Yun-Heub | - |
| dc.date.accessioned | 2022-07-16T13:28:01Z | - |
| dc.date.available | 2022-07-16T13:28:01Z | - |
| dc.date.issued | 2012-10 | - |
| dc.identifier.issn | 0021-4922 | - |
| dc.identifier.issn | 1347-4065 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/164541 | - |
| dc.description.abstract | We present a bidirectional two-terminal switching device using a Schottky barrier for spin-transfer-torque magnetic random access memory (STT-MRAM), which is composed of a Schottky barrier contact with a metal/semiconductor/metal (M/S/M) structure. The proposed M/S/M switching device provides a bidirectional current flow sufficient to write STT-MRAM using a punch through with an extended depletion region at a junction under a reverse bias of M/S or S/M. In addition, a high on-off ratio of 105 is confirmed under the read condition, which is acceptable for the operation of STT-MRAM. From this work, it is expected that an M/S/M structure with bilateral Schottky junctions will be a promising switch device for STT-MRAM beyond 20 nm. | - |
| dc.format.extent | 5 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | IOP Publishing Ltd | - |
| dc.title | Bidirectional Two-Terminal Switching Device Using Schottky Barrier for Spin-Transfer-Torque Magnetic Random Access Memory | - |
| dc.type | Article | - |
| dc.publisher.location | 영국 | - |
| dc.identifier.doi | 10.1143/JJAP.51.106501 | - |
| dc.identifier.scopusid | 2-s2.0-84867749928 | - |
| dc.identifier.wosid | 000310705700052 | - |
| dc.identifier.bibliographicCitation | Japanese Journal of Applied Physics, v.51, no.10, pp 1 - 5 | - |
| dc.citation.title | Japanese Journal of Applied Physics | - |
| dc.citation.volume | 51 | - |
| dc.citation.number | 10 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 5 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | VOLTAGE-DEPENDENCE | - |
| dc.subject.keywordPlus | DIODES | - |
| dc.identifier.url | https://iopscience.iop.org/article/10.1143/JJAP.51.106501 | - |
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