Electrical Bistabilities and Memory Stabilities of Organic Bistable Devices Utilizing C-60 Molecules Embedded in a Polymethyl Methacylate Matrix with an Al2O3 Blocking Layer
DC Field | Value | Language |
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dc.contributor.author | Ko, Seong Hoon | - |
dc.contributor.author | Yoo, Chan Ho | - |
dc.contributor.author | Kim, Tae Whan | - |
dc.date.accessioned | 2022-07-16T14:35:17Z | - |
dc.date.available | 2022-07-16T14:35:17Z | - |
dc.date.created | 2021-05-12 | - |
dc.date.issued | 2012-07 | - |
dc.identifier.issn | 0013-4651 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/165129 | - |
dc.description.abstract | Current-voltage (I-V) curves for Al/fullerene (C-60) nanoparticles embedded in poly(methylmethacrylate) (PMMA) layer/indium-tin oxide (ITO) organic bistable devices (OBDs) with an Al2O3 blocking layer showed a current bistability. The ON and OFF currents of the OBDs with an Al2O3 blocking layer at 1 V were 1 x 10(-5) and 1 x 10(-8) angstrom, respectively, and their ON/OFF ratio is 1 x 10(3), which was much larger than those of the OBDs without an Al2O3 blocking layer. Write-read-erase-read characteristics showed that the OBDs exhibited wide-range current hysteresis, which could be used as rewritable nonvolatile memory cells. The endurance number of the ON/OFF switchings for the OBDs was above 5 x 10(4) cycles. The effect of the Al2O3 blocking layer on the Al/C-60 nanoparticles embedded in PMMA layer/Al2O3/ITO device is described on the basis of the I-V results. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | ELECTROCHEMICAL SOC INC | - |
dc.title | Electrical Bistabilities and Memory Stabilities of Organic Bistable Devices Utilizing C-60 Molecules Embedded in a Polymethyl Methacylate Matrix with an Al2O3 Blocking Layer | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Tae Whan | - |
dc.identifier.doi | 10.1149/2.074208jes | - |
dc.identifier.scopusid | 2-s2.0-85016912028 | - |
dc.identifier.wosid | 000308559400074 | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.159, no.8, pp.G93 - G96 | - |
dc.relation.isPartOf | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | - |
dc.citation.title | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | - |
dc.citation.volume | 159 | - |
dc.citation.number | 8 | - |
dc.citation.startPage | G93 | - |
dc.citation.endPage | G96 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Electrochemistry | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalWebOfScienceCategory | Electrochemistry | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | NONVOLATILE | - |
dc.subject.keywordPlus | INTEGRATION | - |
dc.subject.keywordPlus | TRANSISTOR | - |
dc.subject.keywordPlus | TRANSPORT | - |
dc.identifier.url | https://iopscience.iop.org/article/10.1149/2.074208jes | - |
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