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Electronic Structures and Carrier Distributions of T-Shaped AlxGa1-xAs/AlyGa1-yAs Quantum Wires Fabricated by a Cleaved-Edge Overgrowth Method

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dc.contributor.authorKim, D. H.-
dc.contributor.authorYou, J. H.-
dc.contributor.authorKim, J. H.-
dc.contributor.authorYoo, K. H.-
dc.contributor.authorKim, T. W.-
dc.date.accessioned2022-07-16T14:40:37Z-
dc.date.available2022-07-16T14:40:37Z-
dc.date.issued2012-07-
dc.identifier.issn1533-4880-
dc.identifier.issn1533-4899-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/165185-
dc.description.abstractThe electronic structures and carrier distributions of T-shaped AlxGa1-xAs/Al(y)Gal(1-y)As quantum wire (QWR) consisting of crossed arm and stem wells were numerically calculated by using a finite-difference method (FDM). The electronic subband energies in the arm and the stem wells were numerically calculated by using the FDM taking into account two-band Hamiltonian systems considering with and without strain and nonparabolicity effects. The band deformation due to strain and the probabilistic electron confinement of T-shaped AlxGa1-xAs/Al(y)Gal(1-y)As QWRs were also calculated. The transition energy from the ground heavy-hole state (HH1) to the ground electron state (E-1) was 1.584 eV when the strain was not considered and 1.585 eV when the strain effects were included. The excitonic peak energies corresponding to the interband transitions (E-1-HH1) in the T-shaped QWRs determined from the photoluminescence spectra were compared favorably with those determined from the FDM calculations.-
dc.format.extent4-
dc.language영어-
dc.language.isoENG-
dc.publisherAmerican Scientific Publishers-
dc.titleElectronic Structures and Carrier Distributions of T-Shaped AlxGa1-xAs/AlyGa1-yAs Quantum Wires Fabricated by a Cleaved-Edge Overgrowth Method-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1166/jnn.2012.6391-
dc.identifier.scopusid2-s2.0-84865153166-
dc.identifier.wosid000307604700103-
dc.identifier.bibliographicCitationJournal of Nanoscience and Nanotechnology, v.12, no.7, pp 5687 - 5690-
dc.citation.titleJournal of Nanoscience and Nanotechnology-
dc.citation.volume12-
dc.citation.number7-
dc.citation.startPage5687-
dc.citation.endPage5690-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.subject.keywordPlusCONFINEMENT-
dc.subject.keywordPlusWELLS-
dc.subject.keywordPlusGAS-
dc.subject.keywordAuthorT-Shaped AlxGa1-xAs/AlyGa1-y As Quantum Wire-
dc.subject.keywordAuthorProbabilistic Electron Confinement-
dc.subject.keywordAuthorDeformation Potential-
dc.subject.keywordAuthorInterband Transition-
dc.identifier.urlhttps://www.ingentaconnect.com/content/asp/jnn/2012/00000012/00000007/art00103-
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