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"Double-layer" method to improve image quality of industria SPECT
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Jang Guen | - |
| dc.contributor.author | Seo, Hyeonglim | - |
| dc.contributor.author | Kim, Chan Hyeong | - |
| dc.contributor.author | Jung, Seunghun | - |
| dc.contributor.author | Kim, Jongbum | - |
| dc.contributor.author | Moon, Jinho | - |
| dc.contributor.author | Kim, Yeong Sam | - |
| dc.date.accessioned | 2022-07-16T17:22:36Z | - |
| dc.date.available | 2022-07-16T17:22:36Z | - |
| dc.date.issued | 2012-01 | - |
| dc.identifier.issn | 1748-0221 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/166599 | - |
| dc.format.extent | 2 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Institute of Physics | - |
| dc.title | "Double-layer" method to improve image quality of industria SPECT | - |
| dc.type | Article | - |
| dc.publisher.location | 영국 | - |
| dc.identifier.doi | 10.1088/1748-0221/7/01/E01001 | - |
| dc.identifier.scopusid | 2-s2.0-84863013649 | - |
| dc.identifier.wosid | 000303806200114 | - |
| dc.identifier.bibliographicCitation | Journal of Instrumentation, v.7, no.1, pp 1 - 2 | - |
| dc.citation.title | Journal of Instrumentation | - |
| dc.citation.volume | 7 | - |
| dc.citation.number | 1 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 2 | - |
| dc.type.docType | Correction | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Instruments & Instrumentation | - |
| dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
| dc.subject.keywordAuthor | Inspection with gamma rays | - |
| dc.subject.keywordAuthor | Detection of defects | - |
| dc.identifier.url | https://iopscience.iop.org/article/10.1088/1748-0221/7/01/E01001 | - |
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Related Researcher
- Kim, Chan Hyeong
- COLLEGE OF ENGINEERING (DEPARTMENT OF NUCLEAR ENGINEERING)