Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Atomic-Scale Simulations of Early Stage of Oxidation of Vicinal Si(001) Surfaces Using a Reactive Force-Field Potentials

Full metadata record
DC Field Value Language
dc.contributor.authorYun, Kyung-Han-
dc.contributor.authorHwang, Yubin-
dc.contributor.authorChoi, Heechae-
dc.contributor.authorLee, Eung-Kwan-
dc.contributor.authorYoon, Geunsup-
dc.contributor.authorKim, Byung-Hyun-
dc.contributor.authorChung, Yong-Chae-
dc.date.accessioned2022-07-16T18:52:01Z-
dc.date.available2022-07-16T18:52:01Z-
dc.date.issued2011-10-
dc.identifier.issn0021-4922-
dc.identifier.issn1347-4065-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/167470-
dc.description.abstractThe early stages of the oxidation process on vicinal Si(001) surfaces were studied at the atomic scale using reactive-force field-based molecular dynamics simulations. Oxygen molecules at step edges on the vicinal Si(001) surface showed higher reactivity than those on flat terraces. In macroscopic simulations of oxidation on vicinal Si(001) surfaces with different miscut angles (0 degrees, 5.5 degrees, 10.5 degrees), we found that the initiation of oxidation with higher miscut angles was earlier than with lower angles. These results clearly show that a high density of step edges on the vicinal Si surface accelerates the initial oxidation.-
dc.format.extent5-
dc.language영어-
dc.language.isoENG-
dc.publisherIOP Publishing Ltd-
dc.titleAtomic-Scale Simulations of Early Stage of Oxidation of Vicinal Si(001) Surfaces Using a Reactive Force-Field Potentials-
dc.typeArticle-
dc.publisher.location영국-
dc.identifier.doi10.1143/JJAP.50.10PF01-
dc.identifier.scopusid2-s2.0-80054904028-
dc.identifier.wosid000297695500022-
dc.identifier.bibliographicCitationJapanese Journal of Applied Physics, v.50, no.10, pp 1 - 5-
dc.citation.titleJapanese Journal of Applied Physics-
dc.citation.volume50-
dc.citation.number10-
dc.citation.startPage1-
dc.citation.endPage5-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusINTERFACE STRUCTURE-
dc.subject.keywordPlusMOLECULAR-DYNAMICS-
dc.subject.keywordPlusTHERMAL-OXIDATION-
dc.subject.keywordPlusSI(100)-
dc.subject.keywordPlusSTEP-
dc.subject.keywordPlusSILICON-
dc.subject.keywordPlusOXYGEN-
dc.subject.keywordPlusMODEL-
dc.identifier.urlhttps://iopscience.iop.org/article/10.1143/JJAP.50.10PF01-
Files in This Item
Go to Link
Appears in
Collections
서울 공과대학 > 서울 신소재공학부 > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Chung, Yong Chae photo

Chung, Yong Chae
COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE