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Polymer-ultrathin graphite sheet-polymer composite structured flexible nonvolatile bistable organic memory devices

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dc.contributor.authorSon, Dong Ick-
dc.contributor.authorShim, Jae Ho-
dc.contributor.authorPark, Dong Hee-
dc.contributor.authorJung, Jae Hun-
dc.contributor.authorLee, Jung Min-
dc.contributor.authorPark, Won Il-
dc.contributor.authorKim, Tae Whan-
dc.contributor.authorChoi, Won Kook-
dc.date.accessioned2022-07-16T20:00:33Z-
dc.date.available2022-07-16T20:00:33Z-
dc.date.created2021-05-12-
dc.date.issued2011-07-
dc.identifier.issn0957-4484-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/168100-
dc.description.abstractWe present data, which were obtained before bending and after bending, for the electrical bistabilities, memory stabilities, and memory mechanisms of three-layer structured flexible bistable organic memory (BOM) devices, which were fabricated utilizing the ultrathin graphite sheets (UGS) sandwiched between insulating poly(methylmethacrylate) (PMMA) polymer layers. The UGS were formed by transferring UGS (about 30 layers) and using a simple spin-coating technique. Transmission electron microscopy (TEM) measurements were performed to investigate the microstructural properties of the PMMA/UGS/PMMA films. Current-voltage (I-V) measurements were carried out to investigate the electrical properties of the BOM devices containing the UGS embedded in the PMMA polymer. Current-time (I-t) and current-cycle measurements under flat and bent conditions were performed to investigate the memory stabilities of the BOM devices. The memory characteristics of the BOM maintained similar device efficiencies after bending and were stable during repeated bendings of the BOM devices. The mechanisms for these characteristics of the fabricated BOM are described on the basis of the I-V results.-
dc.language영어-
dc.language.isoen-
dc.publisherIOP PUBLISHING LTD-
dc.titlePolymer-ultrathin graphite sheet-polymer composite structured flexible nonvolatile bistable organic memory devices-
dc.typeArticle-
dc.contributor.affiliatedAuthorPark, Won Il-
dc.contributor.affiliatedAuthorKim, Tae Whan-
dc.identifier.doi10.1088/0957-4484/22/29/295203-
dc.identifier.scopusid2-s2.0-79960387133-
dc.identifier.wosid000291871200009-
dc.identifier.bibliographicCitationNANOTECHNOLOGY, v.22, no.29, pp.1 - 7-
dc.relation.isPartOfNANOTECHNOLOGY-
dc.citation.titleNANOTECHNOLOGY-
dc.citation.volume22-
dc.citation.number29-
dc.citation.startPage1-
dc.citation.endPage7-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusTHIN-FILM-
dc.subject.keywordPlusCarrier transport-
dc.subject.keywordPlusElectric properties-
dc.subject.keywordPlusGraphite-
dc.subject.keywordPlusInvestments-
dc.identifier.urlhttps://iopscience.iop.org/article/10.1088/0957-4484/22/29/295203-
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서울 공과대학 > 서울 융합전자공학부 > 1. Journal Articles
서울 공과대학 > 서울 신소재공학부 > 1. Journal Articles

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