Optical spectroscopy of single Cd0.6Zn0.4Te/ZnTe quantum dots on Si substrate
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Hong Seok | - |
dc.contributor.author | Rastelli, Armando | - |
dc.contributor.author | Kim, Tae Whan | - |
dc.contributor.author | Park, Hong Lee | - |
dc.contributor.author | Schmidt, Oliver G. | - |
dc.date.accessioned | 2022-07-16T20:01:09Z | - |
dc.date.available | 2022-07-16T20:01:09Z | - |
dc.date.created | 2021-05-12 | - |
dc.date.issued | 2011-07 | - |
dc.identifier.issn | 0040-6090 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/168104 | - |
dc.description.abstract | Microphotoluminescence (mu-PL) measurements were carried out to investigate the optical properties of single Cd0.6Zn0.4Te/ZnTe quantum dots (QDs) grown on Si (001) substrate by using molecular beam epitaxy. The high quality of single Cd0.6Zn0.4Te/ZnTe QDs is witnessed by resolution-limited emission, negligible background and absence of measurable spectral jitter or blinking. Polarization-dependent and power-dependent mu-PL spectroscopy measurements were performed to identify the exciton, the biexciton, and the charged exciton in the emission spectra of single QDs. Furthermore a weak linearly polarized line is observed on the low energy side of the neutral exciton and is ascribed to dark exciton recombination. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.title | Optical spectroscopy of single Cd0.6Zn0.4Te/ZnTe quantum dots on Si substrate | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Tae Whan | - |
dc.identifier.doi | 10.1016/j.tsf.2011.04.128 | - |
dc.identifier.scopusid | 2-s2.0-79958223993 | - |
dc.identifier.wosid | 000292720000063 | - |
dc.identifier.bibliographicCitation | THIN SOLID FILMS, v.519, no.19, pp.6554 - 6556 | - |
dc.relation.isPartOf | THIN SOLID FILMS | - |
dc.citation.title | THIN SOLID FILMS | - |
dc.citation.volume | 519 | - |
dc.citation.number | 19 | - |
dc.citation.startPage | 6554 | - |
dc.citation.endPage | 6556 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.subject.keywordPlus | ELECTRON-SPIN | - |
dc.subject.keywordPlus | EXCITONS | - |
dc.subject.keywordAuthor | Cadmium zinc telluride | - |
dc.subject.keywordAuthor | II-VI compound semiconductors | - |
dc.subject.keywordAuthor | Quantum dots | - |
dc.subject.keywordAuthor | Si substrate | - |
dc.subject.keywordAuthor | Single dot spectroscopy | - |
dc.subject.keywordAuthor | Photoluminescence | - |
dc.subject.keywordAuthor | Molecular beam epitaxy | - |
dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S0040609011009692?via%3Dihub | - |
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