Compton-edge-based energy calibration of double-sided silicon strip detectors in Compton camera

Abstract

Accurate energy calibration of double-sided silicon strip detectors (DSSDs) is very important, but challenging for high-energy photons. In the present study, the calibration was improved by considering the Compton edge additionally to the existing low-energy calibration points. The result, indeed, was very encouraging. The energy-calibration errors were dramatically reduced, from, on average, 15.5% and 16.9% to 0.47% and 0.31% for the 356 ((133)Ba) and 662 keV ((137)Cs) peaks, respectively. The imaging resolution of a double-scattering-type Compton camera using DSSDs as the scatterer detectors, for a (22)Na point-like source, also was improved, by similar to 9%.