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New BER Expression of MPSK
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jeong, Woojin | - |
| dc.contributor.author | Lee, Jaeyoon | - |
| dc.contributor.author | Yoon, Dongweon | - |
| dc.date.accessioned | 2022-07-16T20:48:25Z | - |
| dc.date.available | 2022-07-16T20:48:25Z | - |
| dc.date.issued | 2011-05 | - |
| dc.identifier.issn | 0018-9545 | - |
| dc.identifier.issn | 1939-9359 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/168545 | - |
| dc.description.abstract | This paper provides a new, exact, and general expression involving 1-D and 2-D Q-functions for the bit error probability of M-ary phase-shift keying (MPSK) under additive white Gaussian noise (AWGN) and fading channels when Gray code bit mapping is employed. Regular patterns in the error probability expression of the kth bit are observed while developing the bit error rate (BER) expression. From these patterns, we then derive a new BER expression for the MPSK constellation. | - |
| dc.format.extent | 9 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Institute of Electrical and Electronics Engineers | - |
| dc.title | New BER Expression of MPSK | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1109/TVT.2011.2114903 | - |
| dc.identifier.scopusid | 2-s2.0-79955963589 | - |
| dc.identifier.wosid | 000290539000055 | - |
| dc.identifier.bibliographicCitation | IEEE Transactions on Vehicular Technology, v.60, no.4, pp 1916 - 1924 | - |
| dc.citation.title | IEEE Transactions on Vehicular Technology | - |
| dc.citation.volume | 60 | - |
| dc.citation.number | 4 | - |
| dc.citation.startPage | 1916 | - |
| dc.citation.endPage | 1924 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalResearchArea | Telecommunications | - |
| dc.relation.journalResearchArea | Transportation | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.relation.journalWebOfScienceCategory | Telecommunications | - |
| dc.relation.journalWebOfScienceCategory | Transportation Science & Technology | - |
| dc.subject.keywordPlus | M-ARY PSK | - |
| dc.subject.keywordPlus | BIT ERROR-PROBABILITY | - |
| dc.subject.keywordPlus | FADING CHANNELS | - |
| dc.subject.keywordPlus | COMPUTATION | - |
| dc.subject.keywordPlus | CONSTELLATIONS | - |
| dc.subject.keywordPlus | AMPLITUDE | - |
| dc.subject.keywordAuthor | Bit error probability | - |
| dc.subject.keywordAuthor | gray coding | - |
| dc.subject.keywordAuthor | M-ary phase-shift keying (MPSK) | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/5713852 | - |
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Related Researcher
- Yoon, Dongweon
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)