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21-4: Distinguished Paper: Experimental Decomposition of the Positive Bias Temperature Stress-induced Instability in Self-aligned Coplanar InGaZnO Thin-film Transistors and its Modeling based on the Multiple Stretched-exponential Functions
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 오새룬터 | - |
| dc.date.accessioned | 2022-08-09T02:08:35Z | - |
| dc.date.available | 2022-08-09T02:08:35Z | - |
| dc.date.issued | 20170523 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/170674 | - |
| dc.title | 21-4: Distinguished Paper: Experimental Decomposition of the Positive Bias Temperature Stress-induced Instability in Self-aligned Coplanar InGaZnO Thin-film Transistors and its Modeling based on the Multiple Stretched-exponential Functions | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | SID (Society for Information Display) International Symposium | - |
| dc.citation.conferencePlace | Los Angeles Convention Center, Los Angeles, CA, USA | - |
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Related Researcher
- OH, SAE ROON TER
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)