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Photocurrent Spectroscopy 와 Electroreflectance Spectroscopy를 이용한 InGaN/GaN 다중양자우물의 내부전기장세게의 측정
- Authors
- 심종인
- Issue Date
- 25-Aug-2010
- Place
- 한양대
- Conference Name
- 제 2회 LED 반도체조명학회 국내학술대회
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Related Researcher
- Shim, Jong In
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY (DEPARTMENT OF PHOTONICS AND NANOELECTRONICS)