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Orientations of polycrystalline ZnO at the buried interface of oxide thin film transistors (TFTs): A grazing incidence X-ray diffraction study
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Joo Hyung | - |
| dc.contributor.author | Park, SHK | - |
| dc.contributor.author | Jeong, HY | - |
| dc.contributor.author | Park, C | - |
| dc.contributor.author | Choi, SY | - |
| dc.contributor.author | Choi, JY | - |
| dc.contributor.author | Han, SH | - |
| dc.contributor.author | Yoon, TH | - |
| dc.date.accessioned | 2022-10-07T10:35:22Z | - |
| dc.date.available | 2022-10-07T10:35:22Z | - |
| dc.date.issued | 2008-04 | - |
| dc.identifier.issn | 0253-2964 | - |
| dc.identifier.issn | 1229-5949 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/172103 | - |
| dc.format.extent | 2 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | 대한화학회 | - |
| dc.title | Orientations of polycrystalline ZnO at the buried interface of oxide thin film transistors (TFTs): A grazing incidence X-ray diffraction study | - |
| dc.type | Article | - |
| dc.publisher.location | 대한민국 | - |
| dc.identifier.doi | 10.5012/bkcs.2008.29.4.727 | - |
| dc.identifier.scopusid | 2-s2.0-44149125281 | - |
| dc.identifier.wosid | 000256000700003 | - |
| dc.identifier.bibliographicCitation | Bulletin of the Korean Chemical Society, v.29, no.4, pp 727 - 728 | - |
| dc.citation.title | Bulletin of the Korean Chemical Society | - |
| dc.citation.volume | 29 | - |
| dc.citation.number | 4 | - |
| dc.citation.startPage | 727 | - |
| dc.citation.endPage | 728 | - |
| dc.type.docType | Article | - |
| dc.identifier.kciid | ART001235726 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.description.journalRegisteredClass | kci | - |
| dc.relation.journalResearchArea | Chemistry | - |
| dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
| dc.subject.keywordAuthor | grazing-incidence X-ray diffraction | - |
| dc.subject.keywordAuthor | ZnO | - |
| dc.subject.keywordAuthor | thin film transistors | - |
| dc.identifier.url | http://koreascience.or.kr/article/JAKO200802727300818.page | - |
- Appears in
Collections - 서울 자연과학대학 > 서울 화학과 > 1. Journal Articles
- 서울 공과대학 > 서울 공학교육혁신센터 > 1. Journal Articles
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Related Researcher
- Yoon, Tae Hyun
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF CHEMISTRY)