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Memory effect of nonvolatile bistable devices based on CdSe/ZnS nanoparticles sandwiched between C-60 layers
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Li, Fushan | - |
| dc.contributor.author | Son, Dong-Ick | - |
| dc.contributor.author | Ham, Jung-Hun | - |
| dc.contributor.author | Kim, Bong-Jun | - |
| dc.contributor.author | Jung, Jae Hun | - |
| dc.contributor.author | Kim, Tae Whan | - |
| dc.date.accessioned | 2022-10-07T10:55:40Z | - |
| dc.date.available | 2022-10-07T10:55:40Z | - |
| dc.date.issued | 2007-10 | - |
| dc.identifier.issn | 0003-6951 | - |
| dc.identifier.issn | 1077-3118 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/172232 | - |
| dc.description.abstract | Current-voltage and conductance-voltage (G-V) measurements on three-layer Al/C-60/CdSe nanoparticles/C-60/indium tin oxide (ITO) structures fabricated by using a spin-coating method showed a nonvolatile electrical bistable behavior. Capacitance-voltage (C-V) measurements on Al/C-60/CdSe nanoparticles/C-60/ITO structures showed a clockwise hysteresis with a flatband voltage shift due to the existence of the CdSe nanoparticles, indicative of memory effects in the devices. Current-time measurements showed that the devices exhibited excellent memory retention ability at ambient conditions. Possible operating mechanisms for the memory effects in the Al/C-60/CdSe nanoparticles/C-60/ITO devices are described on the basis of the G-V and the C-V results. | - |
| dc.format.extent | 4 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | American Institute of Physics | - |
| dc.title | Memory effect of nonvolatile bistable devices based on CdSe/ZnS nanoparticles sandwiched between C-60 layers | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1063/1.2801357 | - |
| dc.identifier.scopusid | 2-s2.0-35548944891 | - |
| dc.identifier.wosid | 000250295700045 | - |
| dc.identifier.bibliographicCitation | Applied Physics Letters, v.91, no.16, pp 1 - 4 | - |
| dc.citation.title | Applied Physics Letters | - |
| dc.citation.volume | 91 | - |
| dc.citation.number | 16 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 4 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | THIN-FILM TRANSISTORS | - |
| dc.subject.keywordPlus | QUANTUM-DOT | - |
| dc.subject.keywordPlus | NANOCRYSTALS | - |
| dc.subject.keywordPlus | SYSTEM | - |
| dc.subject.keywordPlus | CELLS | - |
| dc.identifier.url | https://aip.scitation.org/doi/10.1063/1.2801357 | - |
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