Cited 0 time in
Relevant, systematic variation of morphology and magnetism according to annealing in InMnP : Zn
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Shon, Yoon | - |
| dc.contributor.author | Lee, Seungwoong | - |
| dc.contributor.author | Park, Chang-soo | - |
| dc.contributor.author | Lee, Sejoon | - |
| dc.contributor.author | Jeon, Hee Change | - |
| dc.contributor.author | Kim, Deukyoung | - |
| dc.contributor.author | Kang, Taewon Wang | - |
| dc.contributor.author | Yoon, Chong Seung | - |
| dc.contributor.author | Kim, Eun Kyu | - |
| dc.contributor.author | Lee, Jeoung Ju | - |
| dc.date.accessioned | 2022-10-07T10:57:41Z | - |
| dc.date.available | 2022-10-07T10:57:41Z | - |
| dc.date.issued | 2007-09 | - |
| dc.identifier.issn | 0169-4332 | - |
| dc.identifier.issn | 1873-5584 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/172249 | - |
| dc.description.abstract | InMnP:Zn epilayers doped with Mn (0.290 at.%) were annealed at 723-873 K for 60 s and 473-573 K for 30 min. Using Auger electron spectroscopy, the changes in concentration profiles of the epilayers correlated to the ferromagnetic origin as a function of the annealing conditions. The epilayers annealed at 723-873 K for 60 s exhibited InMn3 persisting up to 583 K. For InMnP:Zn epilayers annealed at 523-573 K for 30 min, the concentration depth profiles remained flat so that the stoichiometry was well maintained without precipitates such as InMn3 and MnP comparable to the as-grown InP:Zn before doping Mn. These samples showed clear ferromagnetic hysteresis loops. Curie temperature was about 150 K. A ferromagnetic hysteresis loop was obtained even at very lower annealing temperature of 473 K. | - |
| dc.format.extent | 5 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Elsevier BV | - |
| dc.title | Relevant, systematic variation of morphology and magnetism according to annealing in InMnP : Zn | - |
| dc.type | Article | - |
| dc.publisher.location | 네델란드 | - |
| dc.identifier.doi | 10.1016/j.apsusc.2007.06.020 | - |
| dc.identifier.scopusid | 2-s2.0-35348916563 | - |
| dc.identifier.wosid | 000251201600012 | - |
| dc.identifier.bibliographicCitation | Applied Surface Science, v.254, no.2, pp 494 - 498 | - |
| dc.citation.title | Applied Surface Science | - |
| dc.citation.volume | 254 | - |
| dc.citation.number | 2 | - |
| dc.citation.startPage | 494 | - |
| dc.citation.endPage | 498 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Chemistry | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
| dc.subject.keywordPlus | SEMICONDUCTORS | - |
| dc.subject.keywordPlus | MN | - |
| dc.subject.keywordPlus | FERROMAGNETISM | - |
| dc.subject.keywordPlus | GAP | - |
| dc.subject.keywordPlus | INP | - |
| dc.subject.keywordAuthor | MOCVD | - |
| dc.subject.keywordAuthor | MBE | - |
| dc.subject.keywordAuthor | InMnP : Zn epilayer | - |
| dc.subject.keywordAuthor | morphology | - |
| dc.subject.keywordAuthor | auger electron spectroscopy | - |
| dc.subject.keywordAuthor | hysteresis loop | - |
| dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S0169433207008082?via%3Dihub | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1366
COPYRIGHT © 2024 HANYANG UNIVERSITY.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.
