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Formation of gold nanoparticles embedded in a polyimide film for nanofloating gate memory
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Jung H. | - |
| dc.contributor.author | Baek, Kwang H. | - |
| dc.contributor.author | Kim, Chang Kyung | - |
| dc.contributor.author | Kim, Young Bae | - |
| dc.contributor.author | Yoon, Chong Seung | - |
| dc.date.accessioned | 2022-10-07T11:31:17Z | - |
| dc.date.available | 2022-10-07T11:31:17Z | - |
| dc.date.issued | 2007-03 | - |
| dc.identifier.issn | 0003-6951 | - |
| dc.identifier.issn | 1077-3118 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/172329 | - |
| dc.description.abstract | A monolayer of vertically aligned Au nanoparticles embedded in a dielectric film was fabricated by sandwiching a 3.4-nm-thick Au film between two polyimide (PI) precursor layers. Au formed uniform-sized nanoparticles on the PI precursor and coalesced into 10 nm sized nanoparticles during imidization, forming a well-dispersed monolayer of Au nanoparticles embedded in PI. Capacitance-voltage measurement at 300 K showed that the monolayer of Au nanoparticles functioning as a floating gate in Al/PI/Au nanoparticles/PI/Si metal-insulator-semiconductor-type capacitor exhibited a capacitance hysteresis of 3.4 V at an applied voltage of 6 V. The memory effect can be potentially utilized in next generation flash memories. | - |
| dc.format.extent | 4 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | American Institute of Physics | - |
| dc.title | Formation of gold nanoparticles embedded in a polyimide film for nanofloating gate memory | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1063/1.2716345 | - |
| dc.identifier.scopusid | 2-s2.0-33947683412 | - |
| dc.identifier.wosid | 000245135800102 | - |
| dc.identifier.bibliographicCitation | Applied Physics Letters, v.90, no.12, pp 1 - 4 | - |
| dc.citation.title | Applied Physics Letters | - |
| dc.citation.volume | 90 | - |
| dc.citation.number | 12 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 4 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | ROOM-TEMPERATURE | - |
| dc.subject.keywordPlus | COULOMB-BLOCKADE | - |
| dc.subject.keywordPlus | TRANSISTORS | - |
| dc.subject.keywordPlus | MICROSCOPE | - |
| dc.subject.keywordPlus | DIFFUSION | - |
| dc.identifier.url | https://aip.scitation.org/doi/10.1063/1.2716345 | - |
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