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A small CMOS temperature sensor with a inaccuracy of -0.6°C-1.1°C from 25°C-115°C
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Tai-Soon | - |
| dc.contributor.author | Park, Sang-Gyu | - |
| dc.date.accessioned | 2022-12-20T11:24:24Z | - |
| dc.date.available | 2022-12-20T11:24:24Z | - |
| dc.date.created | 2022-09-16 | - |
| dc.date.issued | 2010-10 | - |
| dc.identifier.issn | 1738-7558 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/173578 | - |
| dc.description.abstract | The paper presents a very small size temperature sensor designed using a 0.35um CMOS process. Core transistors of the sensor operate in the intermediate-inversion region and its size is only 17.5um·15.5um with dummy transistors. Measurement result of the temperature sensor represents -0.6°C-+1.1°C of errors in 25°C-115°C temperature range after of two-point calibration. This temperature sensor can be placed in the active pixel area or driving circuit area which needed temperature compensation. | - |
| dc.language | 영어 | - |
| dc.language.iso | en | - |
| dc.publisher | IMID | - |
| dc.title | A small CMOS temperature sensor with a inaccuracy of -0.6°C-1.1°C from 25°C-115°C | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Park, Sang-Gyu | - |
| dc.identifier.scopusid | 2-s2.0-79959934129 | - |
| dc.identifier.bibliographicCitation | Proceedings of International Meeting on Information Display, pp.658 - 659 | - |
| dc.relation.isPartOf | Proceedings of International Meeting on Information Display | - |
| dc.citation.title | Proceedings of International Meeting on Information Display | - |
| dc.citation.startPage | 658 | - |
| dc.citation.endPage | 659 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Conference Paper | - |
| dc.description.journalClass | 1 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.subject.keywordPlus | Active pixel | - |
| dc.subject.keywordPlus | CMOS processs | - |
| dc.subject.keywordPlus | Driving circuits | - |
| dc.subject.keywordPlus | Intermediate-inversion region | - |
| dc.subject.keywordPlus | Measurement results | - |
| dc.subject.keywordPlus | Small size | - |
| dc.subject.keywordPlus | Temperature compensation | - |
| dc.subject.keywordPlus | Temperature range | - |
| dc.subject.keywordPlus | Two-point calibration | - |
| dc.subject.keywordPlus | Calibration | - |
| dc.subject.keywordPlus | CMOS integrated circuits | - |
| dc.subject.keywordPlus | Manufacture | - |
| dc.subject.keywordPlus | Temperature distribution | - |
| dc.subject.keywordPlus | Temperature sensors | - |
| dc.subject.keywordAuthor | Intermediate-inversion region | - |
| dc.subject.keywordAuthor | Temperature compensation | - |
| dc.subject.keywordAuthor | Temperature sensor | - |
| dc.subject.keywordAuthor | Two-point calibration | - |
| dc.identifier.url | http://www.imid.or.kr/2010/sub01/sub01_01.html | - |
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Related Researcher
- Park, Sang Gyu
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)