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Fabrication of microstructured silicon (mu s-Si) from a bulk Si wafer and its use in the printing of high-performance thin-film transistors on plastic substrates
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Keon Jae | - |
| dc.contributor.author | Ahn, Heejoon | - |
| dc.contributor.author | Motala, Michael J. | - |
| dc.contributor.author | Nuzzo, Ralph G. | - |
| dc.contributor.author | Menard, Etienne | - |
| dc.contributor.author | Rogers, John A. | - |
| dc.date.accessioned | 2022-12-20T16:31:56Z | - |
| dc.date.available | 2022-12-20T16:31:56Z | - |
| dc.date.issued | 2010-07 | - |
| dc.identifier.issn | 0960-1317 | - |
| dc.identifier.issn | 1361-6439 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/174485 | - |
| dc.description.abstract | In this paper, we report a new fabrication route to generate microstructured, single-crystalline silicon (mu s-Si) ribbons using (1 1 0) silicon. Two different methods were explored for producing these printable structures. This work also introduces a second-process innovation in the fabrication of microstructured semiconductor objects for printed large-area circuits, namely the direct integration of a high-quality, thermally grown silicon dioxide (SiO2) layer for use as a gate dielectric in top-gate metal-oxide-silicon field effect transistors. We also demonstrate and characterize a soft, conformable lamination process that considerably enhances the mechanical stability of devices printed on plastic, allowing bending radii as small as 0.8 cm. These structures enable a reduction of the bending strains localized at the device interface. These improvements were fully characterized by finite element simulations of the strain distribution present in a descriptive model of the multilayer laminated circuit. | - |
| dc.format.extent | 8 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Institute of Physics Publishing | - |
| dc.title | Fabrication of microstructured silicon (mu s-Si) from a bulk Si wafer and its use in the printing of high-performance thin-film transistors on plastic substrates | - |
| dc.type | Article | - |
| dc.publisher.location | 영국 | - |
| dc.identifier.doi | 10.1088/0960-1317/20/7/075018 | - |
| dc.identifier.scopusid | 2-s2.0-77953957560 | - |
| dc.identifier.wosid | 000279260400018 | - |
| dc.identifier.bibliographicCitation | Journal of Micromechanics and Microengineering, v.20, no.7, pp 1 - 8 | - |
| dc.citation.title | Journal of Micromechanics and Microengineering | - |
| dc.citation.volume | 20 | - |
| dc.citation.number | 7 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 8 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
| dc.relation.journalResearchArea | Instruments & Instrumentation | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
| dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | FIELD-EFFECT TRANSISTOR | - |
| dc.subject.keywordPlus | LARGE-AREA | - |
| dc.subject.keywordPlus | ELECTRONICS | - |
| dc.subject.keywordPlus | MOBILITY | - |
| dc.subject.keywordPlus | SOFT | - |
| dc.subject.keywordPlus | MECHANISM | - |
| dc.subject.keywordPlus | DISPLAYS | - |
| dc.subject.keywordPlus | RIBBONS | - |
| dc.subject.keywordPlus | ARRAYS | - |
| dc.subject.keywordPlus | CMOS | - |
| dc.identifier.url | https://iopscience.iop.org/article/10.1088/0960-1317/20/7/075018 | - |
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