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Fabrication of microstructured silicon (mu s-Si) from a bulk Si wafer and its use in the printing of high-performance thin-film transistors on plastic substrates

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dc.contributor.authorLee, Keon Jae-
dc.contributor.authorAhn, Heejoon-
dc.contributor.authorMotala, Michael J.-
dc.contributor.authorNuzzo, Ralph G.-
dc.contributor.authorMenard, Etienne-
dc.contributor.authorRogers, John A.-
dc.date.accessioned2022-12-20T16:31:56Z-
dc.date.available2022-12-20T16:31:56Z-
dc.date.issued2010-07-
dc.identifier.issn0960-1317-
dc.identifier.issn1361-6439-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/174485-
dc.description.abstractIn this paper, we report a new fabrication route to generate microstructured, single-crystalline silicon (mu s-Si) ribbons using (1 1 0) silicon. Two different methods were explored for producing these printable structures. This work also introduces a second-process innovation in the fabrication of microstructured semiconductor objects for printed large-area circuits, namely the direct integration of a high-quality, thermally grown silicon dioxide (SiO2) layer for use as a gate dielectric in top-gate metal-oxide-silicon field effect transistors. We also demonstrate and characterize a soft, conformable lamination process that considerably enhances the mechanical stability of devices printed on plastic, allowing bending radii as small as 0.8 cm. These structures enable a reduction of the bending strains localized at the device interface. These improvements were fully characterized by finite element simulations of the strain distribution present in a descriptive model of the multilayer laminated circuit.-
dc.format.extent8-
dc.language영어-
dc.language.isoENG-
dc.publisherInstitute of Physics Publishing-
dc.titleFabrication of microstructured silicon (mu s-Si) from a bulk Si wafer and its use in the printing of high-performance thin-film transistors on plastic substrates-
dc.typeArticle-
dc.publisher.location영국-
dc.identifier.doi10.1088/0960-1317/20/7/075018-
dc.identifier.scopusid2-s2.0-77953957560-
dc.identifier.wosid000279260400018-
dc.identifier.bibliographicCitationJournal of Micromechanics and Microengineering, v.20, no.7, pp 1 - 8-
dc.citation.titleJournal of Micromechanics and Microengineering-
dc.citation.volume20-
dc.citation.number7-
dc.citation.startPage1-
dc.citation.endPage8-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaInstruments & Instrumentation-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusFIELD-EFFECT TRANSISTOR-
dc.subject.keywordPlusLARGE-AREA-
dc.subject.keywordPlusELECTRONICS-
dc.subject.keywordPlusMOBILITY-
dc.subject.keywordPlusSOFT-
dc.subject.keywordPlusMECHANISM-
dc.subject.keywordPlusDISPLAYS-
dc.subject.keywordPlusRIBBONS-
dc.subject.keywordPlusARRAYS-
dc.subject.keywordPlusCMOS-
dc.identifier.urlhttps://iopscience.iop.org/article/10.1088/0960-1317/20/7/075018-
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