CMOS symmetric trace differential stacked spiral inductor
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, J. | - |
dc.contributor.author | Kim, H. | - |
dc.date.accessioned | 2022-12-20T16:34:33Z | - |
dc.date.available | 2022-12-20T16:34:33Z | - |
dc.date.created | 2022-08-27 | - |
dc.date.issued | 2010-07 | - |
dc.identifier.issn | 0013-5194 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/174510 | - |
dc.description.abstract | A miniature silicon-based symmetric trace differential stacked spiral inductor (SDSSI) has been implemented using standard 0.18 mu m CMOS technology. Based on the measured two-port S-parameter using a standard de-embedding procedure, the self-resonance frequency (f(sr)) and quality factor (Q) of the SDSSI were compared to a conventional differential stacked spiral inductor (DSSI). The f(sr) of the SDSSI was nearly 2.5 times higher than that of the DSSI, and the Q value of the SDSSI was also enhanced. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | INST ENGINEERING TECHNOLOGY-IET | - |
dc.title | CMOS symmetric trace differential stacked spiral inductor | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, H. | - |
dc.identifier.doi | 10.1049/el.2010.1234 | - |
dc.identifier.scopusid | 2-s2.0-77954617246 | - |
dc.identifier.wosid | 000279559400028 | - |
dc.identifier.bibliographicCitation | ELECTRONICS LETTERS, v.46, no.14, pp.1005 - U70 | - |
dc.relation.isPartOf | ELECTRONICS LETTERS | - |
dc.citation.title | ELECTRONICS LETTERS | - |
dc.citation.volume | 46 | - |
dc.citation.number | 14 | - |
dc.citation.startPage | 1005 | - |
dc.citation.endPage | U70 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.identifier.url | https://digital-library.theiet.org/content/journals/10.1049/el.2010.1234 | - |
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